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ADC12DJ3200AAV - 144-FCBGA

ADC12DJ3200AAV

Active
Texas Instruments

12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC) 144-FCCSP -40 TO 85

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ADC12DJ3200AAV - 144-FCBGA

ADC12DJ3200AAV

Active
Texas Instruments

12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC) 144-FCCSP -40 TO 85

Technical Specifications

Parameters and characteristics commom to parts in this series

SpecificationADC12DJ3200AAVADC12DJ3200 Series
ArchitectureFlashFlash
ConfigurationMUX-ADCMUX-ADC
Contents-Board(s)
Data InterfaceJESD204BJESD204B
FeaturesSimultaneous SamplingSimultaneous Sampling
Input TypeDifferential, Single EndedDifferential, Single Ended
Mounting TypeSurface MountSurface Mount
Number of A/D Converters22
Number of Bits1212
Number of Inputs1, 21 - 2
Operating Temperature [Max]85 °C85 °C
Operating Temperature [Min]-40 °C-40 °C
Package / CaseFCBGA, 144-FBGAFCBGA, 144-FBGA
Ratio - S/H:ADC0:10:1
Reference TypeInternalInternal
Sampling Rate (Per Second)3.2 G3.2 - 6.4 G
Supplied Contents-Board(s)
Supplier Device Package144-FCBGA (10x10)144-FCBGA (10x10)
Utilized IC / Part-ADC12DJ3200QML-SP
Voltage - Supply, Analog [Max]2 V, 1.15 V1.15 - 2 V
Voltage - Supply, Analog [Min]1.8 V, 1.05 V1.05 - 1.8 V
Voltage - Supply, Digital [Max]1.15 V1.15 V
Voltage - Supply, Digital [Min]1.05 V1.05 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

ADC12DJ3200 Series

12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (ADC)

PartVoltage - Supply, Digital [Max]Voltage - Supply, Digital [Min]Number of InputsSampling Rate (Per Second)Number of A/D ConvertersMounting TypeInput TypeNumber of BitsData InterfaceFeaturesConfigurationReference TypeArchitectureOperating Temperature [Min]Operating Temperature [Max]Ratio - S/H:ADCVoltage - Supply, Analog [Max]Voltage - Supply, Analog [Min]Package / CaseSupplier Device PackageSupplied ContentsUtilized IC / PartContents
Texas Instruments
ADC12DJ3200ZEGT
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
1.15 V
1.05 V
1, 2
3.2 G, 6.4 G
2
Surface Mount
Differential, Single Ended
12
JESD204B
Simultaneous Sampling
MUX-ADC
Internal
Flash
-40 °C
85 °C
0:1
1.15 V, 2 V
1.05 V, 1.8 V
Texas Instruments
ADC12DJ3200AAV
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
1.15 V
1.05 V
1, 2
3.2 G
2
Surface Mount
Differential, Single Ended
12
JESD204B
Simultaneous Sampling
MUX-ADC
Internal
Flash
-40 °C
85 °C
0:1
1.15 V, 2 V
1.05 V, 1.8 V
144-FBGA, FCBGA
144-FCBGA (10x10)
Texas Instruments
ADC12DJ3200EVMCVAL
ADC12DJ3200QML-SP - 12 Bit 6.4G Samples per Second Analog to Digital Converter (ADC) Evaluation Board
6.4 G
2
12
JESD204B
Board(s)
ADC12DJ3200QML-SP
Board(s)
Texas Instruments
ADC12DJ3200EVMCVAL
ADC12DJ3200QML-SP - 12 Bit 6.4G Samples per Second Analog to Digital Converter (ADC) Evaluation Board
6.4 G
2
12
JESD204B
Board(s)
ADC12DJ3200QML-SP
Board(s)
Texas Instruments
ADC12DJ3200ZEG
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
1.15 V
1.05 V
1, 2
3.2 G, 6.4 G
2
Surface Mount
Differential, Single Ended
12
JESD204B
Simultaneous Sampling
MUX-ADC
Internal
Flash
-40 °C
85 °C
0:1
1.15 V, 2 V
1.05 V, 1.8 V

Description

General part information

ADC12DJ3200 Series

The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.