ADC12DJ3200ZEGT
ActiveTexas Instruments
12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC)
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ADC12DJ3200ZEGT
ActiveTexas Instruments
12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC)
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Technical Specifications
Parameters and characteristics commom to parts in this series
| Specification | ADC12DJ3200ZEGT | ADC12DJ3200 Series |
|---|---|---|
| Architecture | Flash | Flash |
| Configuration | MUX-ADC | MUX-ADC |
| Contents | - | Board(s) |
| Data Interface | JESD204B | JESD204B |
| Features | Simultaneous Sampling | Simultaneous Sampling |
| Input Type | Differential, Single Ended | Differential, Single Ended |
| Mounting Type | Surface Mount | Surface Mount |
| Number of A/D Converters | 2 | 2 |
| Number of Bits | 12 | 12 |
| Number of Inputs | 1, 2 | 1 - 2 |
| Operating Temperature [Max] | 85 °C | 85 °C |
| Operating Temperature [Min] | -40 °C | -40 °C |
| Package / Case | - | FCBGA, 144-FBGA |
| Ratio - S/H:ADC | 0:1 | 0:1 |
| Reference Type | Internal | Internal |
| Sampling Rate (Per Second) | 3.2 G, 6.4 G | 3.2 - 6.4 G |
| Supplied Contents | - | Board(s) |
| Supplier Device Package | - | 144-FCBGA (10x10) |
| Utilized IC / Part | - | ADC12DJ3200QML-SP |
| Voltage - Supply, Analog [Max] | 2 V, 1.15 V | 1.15 - 2 V |
| Voltage - Supply, Analog [Min] | 1.8 V, 1.05 V | 1.05 - 1.8 V |
| Voltage - Supply, Digital [Max] | 1.15 V | 1.15 V |
| Voltage - Supply, Digital [Min] | 1.05 V | 1.05 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
ADC12DJ3200 Series
12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (ADC)
| Part | Voltage - Supply, Digital [Max] | Voltage - Supply, Digital [Min] | Number of Inputs | Sampling Rate (Per Second) | Number of A/D Converters | Mounting Type | Input Type | Number of Bits | Data Interface | Features | Configuration | Reference Type | Architecture | Operating Temperature [Min] | Operating Temperature [Max] | Ratio - S/H:ADC | Voltage - Supply, Analog [Max] | Voltage - Supply, Analog [Min] | Package / Case | Supplier Device Package | Supplied Contents | Utilized IC / Part | Contents |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments ADC12DJ3200ZEGTThe ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). | 1.15 V | 1.05 V | 1, 2 | 3.2 G, 6.4 G | 2 | Surface Mount | Differential, Single Ended | 12 | JESD204B | Simultaneous Sampling | MUX-ADC | Internal | Flash | -40 °C | 85 °C | 0:1 | 1.15 V, 2 V | 1.05 V, 1.8 V | |||||
Texas Instruments ADC12DJ3200AAVThe ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). | 1.15 V | 1.05 V | 1, 2 | 3.2 G | 2 | Surface Mount | Differential, Single Ended | 12 | JESD204B | Simultaneous Sampling | MUX-ADC | Internal | Flash | -40 °C | 85 °C | 0:1 | 1.15 V, 2 V | 1.05 V, 1.8 V | 144-FBGA, FCBGA | 144-FCBGA (10x10) | |||
Texas Instruments ADC12DJ3200EVMCVALADC12DJ3200QML-SP - 12 Bit 6.4G Samples per Second Analog to Digital Converter (ADC) Evaluation Board | 6.4 G | 2 | 12 | JESD204B | Board(s) | ADC12DJ3200QML-SP | Board(s) | ||||||||||||||||
Texas Instruments ADC12DJ3200EVMCVALADC12DJ3200QML-SP - 12 Bit 6.4G Samples per Second Analog to Digital Converter (ADC) Evaluation Board | 6.4 G | 2 | 12 | JESD204B | Board(s) | ADC12DJ3200QML-SP | Board(s) | ||||||||||||||||
Texas Instruments ADC12DJ3200ZEGThe ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). | 1.15 V | 1.05 V | 1, 2 | 3.2 G, 6.4 G | 2 | Surface Mount | Differential, Single Ended | 12 | JESD204B | Simultaneous Sampling | MUX-ADC | Internal | Flash | -40 °C | 85 °C | 0:1 | 1.15 V, 2 V | 1.05 V, 1.8 V |
Description
General part information
ADC12DJ3200 Series
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
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