SN74BCT8373ANT
ActiveIC SCAN TEST DEVICE LATCH 24-DIP
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SN74BCT8373ANT
ActiveIC SCAN TEST DEVICE LATCH 24-DIP
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Technical Specifications
Parameters and characteristics commom to parts in this series
| Specification | SN74BCT8373ANT | 74BCT8373 Series |
|---|---|---|
| - | - | |
| Logic Type | Scan Test Device with D-Type Latches | Scan Test Device with D-Type Latches |
| Mounting Type | Through Hole | Surface Mount, Through Hole |
| Number of Bits | 8 | 8 |
| Operating Temperature [Max] | 70 ░C | 70 ░C |
| Operating Temperature [Min] | 0 °C | 0 °C |
| Package / Case | 24-DIP | 24-SOIC, 24-DIP |
| Package / Case | 7.62 mm, 0.3 in | 0.3 - 7.62 mm |
| Package / Case | - | 7.5 mm |
| Package / Case | - | 0.295 in |
| Supplier Device Package | 24-PDIP | 24-SOIC, 24-PDIP |
| Supply Voltage [Max] | 5.5 V | 5.5 V |
| Supply Voltage [Min] | 4.5 V | 4.5 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
74BCT8373 Series
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
| Part | Number of Bits | Mounting Type | Supplier Device Package | Logic Type | Supply Voltage [Min] | Supply Voltage [Max] | Operating Temperature [Max] | Operating Temperature [Min] | Package / Case [y] | Package / Case [x] | Package / Case | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments SN74BCT8373ADWRG4 | 8 | Surface Mount | 24-SOIC | Scan Test Device with D-Type Latches | 4.5 V | 5.5 V | 70 ░C | 0 °C | 7.5 mm | 0.295 in | 24-SOIC | |
Texas Instruments SN74BCT8373DW | ||||||||||||
Texas Instruments SN74BCT8373DWR | ||||||||||||
Texas Instruments SN74BCT8373ANT | 8 | Through Hole | 24-PDIP | Scan Test Device with D-Type Latches | 4.5 V | 5.5 V | 70 ░C | 0 °C | 24-DIP | 0.3 in, 7.62 mm | ||
Texas Instruments SN74BCT8373ADWR | 8 | Surface Mount | 24-SOIC | Scan Test Device with D-Type Latches | 4.5 V | 5.5 V | 70 ░C | 0 °C | 7.5 mm | 0.295 in | 24-SOIC | |
Texas Instruments SN74BCT8373ADW | 8 | Surface Mount | 24-SOIC | Scan Test Device with D-Type Latches | 4.5 V | 5.5 V | 70 ░C | 0 °C | 7.5 mm | 0.295 in | 24-SOIC |
Description
General part information
74BCT8373 Series
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETMtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETMoctal latches.
In the test mode, the normal operation of the SCOPETMoctal latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations, as described in IEEE Standard 1149.1-1990.
Documents
Technical documentation and resources