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ADC08DJ3200AAVT - 144-FCBGA

ADC08DJ3200AAVT

Active
Texas Instruments

8-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC) 144-FCCSP -40 TO 85

ADC08DJ3200AAVT - 144-FCBGA

ADC08DJ3200AAVT

Active
Texas Instruments

8-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC) 144-FCCSP -40 TO 85

Technical Specifications

Parameters and characteristics commom to parts in this series

SpecificationADC08DJ3200AAVTADC08DJ3200 Series
ArchitectureFolding InterpolatingFolding Interpolating
ConfigurationMUX-ADCMUX-ADC
Data InterfaceJESD204B, SerialJESD204B, Serial
FeaturesTemperature SensorTemperature Sensor
Input TypeDifferential, Single EndedDifferential, Single Ended
Mounting TypeSurface MountSurface Mount
Number of A/D Converters-2
Number of Bits88
Number of Inputs21 - 2
Operating Temperature [Max]85 °C85 °C
Operating Temperature [Min]-40 °C-40 °C
Package / CaseFCBGA, 144-FBGAFCBGA, 144-FBGA
Ratio - S/H:ADC0:10:1
Reference TypeInternalInternal
Sampling Rate (Per Second)3.2 G, 6.4 G3.2 - 6.4 G
Supplier Device Package144-FCBGA (10x10)144-FCBGA (10x10)
Voltage - Supply, Analog [Max]2 V, 1.15 V1.15 - 2 V
Voltage - Supply, Analog [Min]1.8 V, 1.05 V1.05 - 1.8 V
Voltage - Supply, Digital [Max]1.15 V1.15 V
Voltage - Supply, Digital [Min]1.05 V1.05 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

ADC08DJ3200 Series

8-Bit, Dual 3.2-GSPS or Single 6.4-GSPS, RF-Sampling Analog-to-Digital Converter (ADC)

PartData InterfaceInput TypeNumber of InputsVoltage - Supply, Digital [Max]Voltage - Supply, Digital [Min]ArchitectureSupplier Device PackageRatio - S/H:ADCNumber of BitsConfigurationMounting TypePackage / CaseReference TypeFeaturesOperating Temperature [Min]Operating Temperature [Max]Sampling Rate (Per Second)Voltage - Supply, Analog [Max]Voltage - Supply, Analog [Min]Number of A/D Converters
Texas Instruments
ADC08DJ3200AAVT
The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC08DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. At 5 GSPS, only four total lanes are required running at 12.5 Gbps or 16 lanes can be used to reduce the lane rate to 3.125 Gbps. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC08DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. At 5 GSPS, only four total lanes are required running at 12.5 Gbps or 16 lanes can be used to reduce the lane rate to 3.125 Gbps. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications.
JESD204B, Serial
Differential, Single Ended
2
1.15 V
1.05 V
Folding Interpolating
144-FCBGA (10x10)
0:1
8
MUX-ADC
Surface Mount
144-FBGA, FCBGA
Internal
Temperature Sensor
-40 °C
85 °C
3.2 G, 6.4 G
1.15 V, 2 V
1.05 V, 1.8 V
Texas Instruments
ADC08DJ3200AAV
The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC08DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. At 5 GSPS, only four total lanes are required running at 12.5 Gbps or 16 lanes can be used to reduce the lane rate to 3.125 Gbps. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC08DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. At 5 GSPS, only four total lanes are required running at 12.5 Gbps or 16 lanes can be used to reduce the lane rate to 3.125 Gbps. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications.
JESD204B, Serial
Differential, Single Ended
1, 2
1.15 V
1.05 V
Folding Interpolating
144-FCBGA (10x10)
8
MUX-ADC
Surface Mount
144-FBGA, FCBGA
Internal
Temperature Sensor
-40 °C
85 °C
3.2 G, 6.4 G
1.15 V, 2 V
1.05 V, 1.8 V
2

Description

General part information

ADC08DJ3200 Series

The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC08DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. At 5 GSPS, only four total lanes are required running at 12.5 Gbps or 16 lanes can be used to reduce the lane rate to 3.125 Gbps. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications.

The ADC08DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC08DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.