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ADC32RF45IRMPT - 72-VQFN

ADC32RF45IRMPT

Active
Texas Instruments

DUAL-CHANNEL, 14-BIT, 3-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC)

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ADC32RF45IRMPT - 72-VQFN

ADC32RF45IRMPT

Active
Texas Instruments

DUAL-CHANNEL, 14-BIT, 3-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (ADC)

Technical Specifications

Parameters and characteristics commom to parts in this series

SpecificationADC32RF45IRMPTADC32RF45 Series
ArchitecturePipelinedPipelined
Data InterfaceJESD204BJESD204B
Input TypeDifferentialDifferential
Mounting TypeSurface MountSurface Mount
Number of A/D Converters88
Number of Bits1414
Number of Inputs22
Operating Temperature [Max]85 °C85 °C
Operating Temperature [Min]-40 °C-40 °C
Package / Case72-VFQFN Exposed Pad72-VFQFN Exposed Pad
Reference TypeInternalInternal
Sampling Rate (Per Second)3 G3 G
Supplier Device Package72-VQFN (10x10)72-VQFN (10x10)
Voltage - Supply, Analog [Max]2 V2 V
Voltage - Supply, Analog [Min]1.1 V1.1 V
Voltage - Supply, Digital [Max]1.2 V1.2 V
Voltage - Supply, Digital [Min]1.1 V1.1 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

ADC32RF45 Series

Dual-channel, 14-bit, 3-GSPS, RF-sampling analog-to-digital converter (ADC)

PartArchitectureVoltage - Supply, Digital [Min]Voltage - Supply, Digital [Max]Supplier Device PackageInput TypeNumber of BitsVoltage - Supply, Analog [Min]Voltage - Supply, Analog [Max]Number of InputsNumber of A/D ConvertersOperating Temperature [Max]Operating Temperature [Min]Package / CaseData InterfaceReference TypeMounting TypeSampling Rate (Per Second)
Texas Instruments
ADC32RF45IRMP
The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C). The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).
Pipelined
1.1 V
1.2 V
72-VQFN (10x10)
Differential
14
1.1 V
2 V
2
8
85 °C
-40 °C
72-VFQFN Exposed Pad
JESD204B
Internal
Surface Mount
3 G
Texas Instruments
ADC32RF45IRMPT
The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C). The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).
Pipelined
1.1 V
1.2 V
72-VQFN (10x10)
Differential
14
1.1 V
2 V
2
8
85 °C
-40 °C
72-VFQFN Exposed Pad
JESD204B
Internal
Surface Mount
3 G

Description

General part information

ADC32RF45 Series

The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy.

Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms.

The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).