ADC32RF45 Series
Dual-channel, 14-bit, 3-GSPS, RF-sampling analog-to-digital converter (ADC)
Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/
Catalog
Dual-channel, 14-bit, 3-GSPS, RF-sampling analog-to-digital converter (ADC)
| Part | Architecture | Voltage - Supply, Digital [Min] | Voltage - Supply, Digital [Max] | Supplier Device Package | Input Type | Number of Bits | Voltage - Supply, Analog [Min] | Voltage - Supply, Analog [Max] | Number of Inputs | Number of A/D Converters | Operating Temperature [Max] | Operating Temperature [Min] | Package / Case | Data Interface | Reference Type | Mounting Type | Sampling Rate (Per Second) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments ADC32RF45IRMP | Pipelined | 1.1 V | 1.2 V | 72-VQFN (10x10) | Differential | 14 | 1.1 V | 2 V | 2 | 8 | 85 °C | -40 °C | 72-VFQFN Exposed Pad | JESD204B | Internal | Surface Mount | 3 G |
Texas Instruments ADC32RF45IRMPT | Pipelined | 1.1 V | 1.2 V | 72-VQFN (10x10) | Differential | 14 | 1.1 V | 2 V | 2 | 8 | 85 °C | -40 °C | 72-VFQFN Exposed Pad | JESD204B | Internal | Surface Mount | 3 G |
Key Features
• 14-Bit, Dual-Channel, 3.0-GSPS ADCNoise Floor: –155 dBFS/HzRF Input Supports Up to 4.0 GHzAperture Jitter: 90 fSChannel Isolation: 95 dB at fIN= 1.8 GHzSpectral Performance (fIN= 900 MHz, –2 dBFS):SNR: 60.9 dBFSSFDR: 67-dBc HD2, HD3SFDR: 77-dBc Worst SpurSpectral Performance (fIN= 1.78 GHz, –2 dBFS):SNR: 58.8 dBFSSFDR: 66-dBc HD2, HD3SFDR: 75-dBc Worst SpurOn-Chip Digital Down-Converters:Up to 4 DDCs (Dual-Band Mode)Up to 3 Independent NCOs per DDCOn-Chip Input Clamp for Overvoltage ProtectionProgrammable On-Chip Power Detectors with Alarm Pins for AGC SupportOn-Chip DitherOn-Chip Input TerminationInput Full-Scale: 1.35 VPPSupport for Multi-Chip SynchronizationJESD204B Interface:Subclass 1-Based Deterministic Latency4 Lanes Per Channel at 12.5 GbpsPower Dissipation: 3.2 W/Ch at 3.0 GSPS72-Pin VQFN Package (10 mm × 10 mm)14-Bit, Dual-Channel, 3.0-GSPS ADCNoise Floor: –155 dBFS/HzRF Input Supports Up to 4.0 GHzAperture Jitter: 90 fSChannel Isolation: 95 dB at fIN= 1.8 GHzSpectral Performance (fIN= 900 MHz, –2 dBFS):SNR: 60.9 dBFSSFDR: 67-dBc HD2, HD3SFDR: 77-dBc Worst SpurSpectral Performance (fIN= 1.78 GHz, –2 dBFS):SNR: 58.8 dBFSSFDR: 66-dBc HD2, HD3SFDR: 75-dBc Worst SpurOn-Chip Digital Down-Converters:Up to 4 DDCs (Dual-Band Mode)Up to 3 Independent NCOs per DDCOn-Chip Input Clamp for Overvoltage ProtectionProgrammable On-Chip Power Detectors with Alarm Pins for AGC SupportOn-Chip DitherOn-Chip Input TerminationInput Full-Scale: 1.35 VPPSupport for Multi-Chip SynchronizationJESD204B Interface:Subclass 1-Based Deterministic Latency4 Lanes Per Channel at 12.5 GbpsPower Dissipation: 3.2 W/Ch at 3.0 GSPS72-Pin VQFN Package (10 mm × 10 mm)
Description
AI
The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy.
Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms.
The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).
The ADC32RF45 device is a 14-bit, 3.0-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF45 delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy.
Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms.
The ADC32RF45 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).