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24-SOIC

SN74BCT8240ADWR

Obsolete
Texas Instruments

IC SCAN TEST DEVICE BUFF 24-SOIC

Find alt
24-SOIC

SN74BCT8240ADWR

Obsolete
Texas Instruments

IC SCAN TEST DEVICE BUFF 24-SOIC

Find alt

Description

General part information

74BCT8240 Series

Scan Test Device with Inverting Buffers IC 24-SOIC

Technical Specifications

Parameters and characteristics for this part

SpecificationSN74BCT8240ADWR
Logic TypeScan Test Device, Inverting Buffers
Mounting TypeSurface Mount
Number of Bits8 bits
Operating Temperature (Max)70 °C
Operating Temperature (Min)0 °C
Package Length0.295 in
Package Name24-SOIC
Package Width7.5 mm
Supply Voltage (Max)5.5 V
Supply Voltage (Min)4.5 V

Pricing

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CAD

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Documents

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