
SN74BCT8240ADWR
ObsoleteTexas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC

SN74BCT8240ADWR
ObsoleteTexas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
Description
General part information
74BCT8240 Series
Scan Test Device with Inverting Buffers IC 24-SOIC
Technical Specifications
Parameters and characteristics for this part
| Specification | SN74BCT8240ADWR |
|---|---|
| Logic Type | Scan Test Device, Inverting Buffers |
| Mounting Type | Surface Mount |
| Number of Bits | 8 bits |
| Operating Temperature (Max) | 70 °C |
| Operating Temperature (Min) | 0 °C |
| Package Length | 0.295 in |
| Package Name | 24-SOIC |
| Package Width | 7.5 mm |
| Supply Voltage (Max) | 5.5 V |
| Supply Voltage (Min) | 4.5 V |
Pricing
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CAD
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Documents
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