74BCT8240 Series

Catalog

IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS

Part	Package Length	Package Name	Package Width	Mounting Type	Supply Voltage (Max)	Supply Voltage (Min)	Number of Bits	Logic Type	Operating Temperature (Max)
Texas Instruments SN74BCT8240ADW	0.295 in	24-SOIC	7.5 mm	Surface Mount	5.5 V	4.5 V	8 bits	Inverting Buffers Scan Test Device	70 °C
Texas Instruments SN74BCT8240ADWR	0.295 in	24-SOIC	7.5 mm	Surface Mount	5.5 V	4.5 V	8 bits	Inverting Buffers Scan Test Device	70 °C
Texas Instruments SN74BCT8240ADWRG4	0.295 in	24-SOIC	7.5 mm	Surface Mount	5.5 V	4.5 V	8 bits	Inverting Buffers Scan Test Device	70 °C
Texas Instruments SN74BCT8240ANT	0.3 in	24-DIP 24-PDIP	7.62 mm	Through Hole	5.5 V	4.5 V	8 bits	Inverting Buffers Scan Test Device	70 °C