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ADC12DL3200ACF - 256-FCBGA

ADC12DL3200ACF

Active
Texas Instruments

12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (LVDS INTERFACE)

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ADC12DL3200ACF - 256-FCBGA

ADC12DL3200ACF

Active
Texas Instruments

12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (LVDS INTERFACE)

Technical Specifications

Parameters and characteristics for this part

SpecificationADC12DL3200ACF
ArchitectureFolding Interpolating
ConfigurationMUX-ADC
Data InterfaceLVDS - Parallel
FeaturesSimultaneous Sampling
Input TypeDifferential, Single Ended
Mounting TypeSurface Mount
Number of A/D Converters2
Number of Bits12
Number of Inputs1, 2
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 °C
Package / CaseFCBGA, 256-BBGA
Ratio - S/H:ADC0:1
Reference TypeInternal
Sampling Rate (Per Second)3.2 G, 6.4 G
Supplier Device Package256-FCBGA (17x17)
Voltage - Supply, Analog [Max]2 V
Voltage - Supply, Analog [Min]1.05 V
Voltage - Supply, Digital [Max]2 V
Voltage - Supply, Digital [Min]1.05 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

ADC12DL3200 Series

12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (LVDS interface)

PartVoltage - Supply, Analog [Min]Voltage - Supply, Analog [Max]Package / CaseConfigurationVoltage - Supply, Digital [Min]Voltage - Supply, Digital [Max]Number of InputsData InterfaceNumber of A/D ConvertersMounting TypeInput TypeRatio - S/H:ADCReference TypeSampling Rate (Per Second)Supplier Device PackageFeaturesOperating Temperature [Min]Operating Temperature [Max]ArchitectureNumber of Bits
Texas Instruments
ADC12DL3200ACF
The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing. The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.
1.05 V
2 V
256-BBGA, FCBGA
MUX-ADC
1.05 V
2 V
1, 2
LVDS - Parallel
2
Surface Mount
Differential, Single Ended
0:1
Internal
3.2 G, 6.4 G
256-FCBGA (17x17)
Simultaneous Sampling
-40 °C
85 °C
Folding Interpolating
12

Description

General part information

ADC12DL3200 Series

The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.

The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.