
ADC12DL3200ACF
Active12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (LVDS INTERFACE)
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ADC12DL3200ACF
Active12-BIT, DUAL 3.2-GSPS OR SINGLE 6.4-GSPS, RF-SAMPLING ANALOG-TO-DIGITAL CONVERTER (LVDS INTERFACE)
Technical Specifications
Parameters and characteristics for this part
Specification | ADC12DL3200ACF |
---|---|
Architecture | Folding Interpolating |
Configuration | MUX-ADC |
Data Interface | LVDS - Parallel |
Features | Simultaneous Sampling |
Input Type | Differential, Single Ended |
Mounting Type | Surface Mount |
Number of A/D Converters | 2 |
Number of Bits | 12 |
Number of Inputs | 1, 2 |
Operating Temperature [Max] | 85 °C |
Operating Temperature [Min] | -40 °C |
Package / Case | FCBGA, 256-BBGA |
Ratio - S/H:ADC | 0:1 |
Reference Type | Internal |
Sampling Rate (Per Second) | 3.2 G, 6.4 G |
Supplier Device Package | 256-FCBGA (17x17) |
Voltage - Supply, Analog [Max] | 2 V |
Voltage - Supply, Analog [Min] | 1.05 V |
Voltage - Supply, Digital [Max] | 2 V |
Voltage - Supply, Digital [Min] | 1.05 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
ADC12DL3200 Series
12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (LVDS interface)
Part | Voltage - Supply, Analog [Min] | Voltage - Supply, Analog [Max] | Package / Case | Configuration | Voltage - Supply, Digital [Min] | Voltage - Supply, Digital [Max] | Number of Inputs | Data Interface | Number of A/D Converters | Mounting Type | Input Type | Ratio - S/H:ADC | Reference Type | Sampling Rate (Per Second) | Supplier Device Package | Features | Operating Temperature [Min] | Operating Temperature [Max] | Architecture | Number of Bits |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments ADC12DL3200ACFThe ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.
The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing. | 1.05 V | 2 V | 256-BBGA, FCBGA | MUX-ADC | 1.05 V | 2 V | 1, 2 | LVDS - Parallel | 2 | Surface Mount | Differential, Single Ended | 0:1 | Internal | 3.2 G, 6.4 G | 256-FCBGA (17x17) | Simultaneous Sampling | -40 °C | 85 °C | Folding Interpolating | 12 |
Description
General part information
ADC12DL3200 Series
The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.
The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.
Documents
Technical documentation and resources