SN74BCT8374ANTG4

Obsolete

IC SCAN TEST DEVICE W/FF 24-DIP

Obsolete

IC SCAN TEST DEVICE W/FF 24-DIP

Description

General part information

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

Parameters and characteristics for this part

Specification	SN74BCT8374ANTG4

Logic Type	Scan Test Device, D-Type Edge-Triggered Flip-Flops
Mounting Type	Through Hole
Number of Bits	8 bits
Operating Temperature (Max)	70 °C
Operating Temperature (Min)	0 °C
Package Length	0.3 in
Package Name	24-DIP, 24-PDIP
Package Width	7.62 mm
Supply Voltage (Max)	5.5 V
Supply Voltage (Min)	4.5 V

Part	Supply Voltage (Max)	Supply Voltage (Min)	Mounting Type	Package Name	Logic Type	Operating Temperature (Max)	Package Length	Package Width	Number of Bits
Texas Instruments SN74BCT8374ADW	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits
Texas Instruments SN74BCT8374ADWR	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits
Texas Instruments SN74BCT8374ANTG4	5.5 V	4.5 V	Through Hole	24-DIP 24-PDIP	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.3 in	7.62 mm	8 bits
Texas Instruments SN74BCT8374ANT	5.5 V	4.5 V	Through Hole	24-DIP 24-PDIP	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.3 in	7.62 mm	8 bits
Texas Instruments SN74BCT8374ADWRG4	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits

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3D models and CAD resources for this part

Technical documentation and resources

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