74BCT8374 Series

Catalog

SPECIALTY FUNCTION LOGIC DEVICE W/OCTAL D-TYP EDGE-TRIG FLIP-FLOP

Part	Supply Voltage (Max)	Supply Voltage (Min)	Mounting Type	Package Name	Logic Type	Operating Temperature (Max)	Package Length	Package Width	Number of Bits
Texas Instruments SN74BCT8374ADW	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits
Texas Instruments SN74BCT8374ADWR	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits
Texas Instruments SN74BCT8374ANTG4	5.5 V	4.5 V	Through Hole	24-DIP 24-PDIP	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.3 in	7.62 mm	8 bits
Texas Instruments SN74BCT8374ANT	5.5 V	4.5 V	Through Hole	24-DIP 24-PDIP	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.3 in	7.62 mm	8 bits
Texas Instruments SN74BCT8374ADWRG4	5.5 V	4.5 V	Surface Mount	24-SOIC	D-Type Edge-Triggered Flip-Flops Scan Test Device	70 °C	0.295 in	7.5 mm	8 bits