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ADC32RF55 Series

Dual-channel 14-bit 3-GSPS RF-sampling ADC with low noise spectral density (NSD)

Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/

Catalog

Dual-channel 14-bit 3-GSPS RF-sampling ADC with low noise spectral density (NSD)

PartSupplier Device PackageNumber of BitsConfigurationReference TypeInput TypeOperating Temperature [Max]Operating Temperature [Min]Mounting TypeVoltage - Supply, Analog [Max]Voltage - Supply, Analog [Min]Number of InputsNumber of A/D ConvertersVoltage - Supply, Digital [Min]Voltage - Supply, Digital [Max]Ratio - S/H:ADCSampling Rate (Per Second)Data InterfacePackage / Case
Texas Instruments
ADC32RF55IRTDT
64-VQFN (9x9)
14
MUX-ADC
External
Single Ended
85 °C
-40 °C
Surface Mount, Wettable Flank
1.225 V, 1.85 V
1.175 V, 1.75 V
4
4
1.175 V
1.225 V
0:4
3 G
Serial, SPI
64-VFQFN Exposed Pad
Texas Instruments
ADC32RF55IRTD
64-VQFN (9x9)
14
MUX-ADC
External
Single Ended
85 °C
-40 °C
Surface Mount, Wettable Flank
1.225 V, 1.85 V
1.175 V, 1.75 V
4
4
1.175 V
1.225 V
0:4
3 G
Serial, SPI
64-VFQFN Exposed Pad

Key Features

14-Bit, dual channel 2.6 to 3-GSPS ADCNoise spectral density:NSD = -155.6 dBFS/Hz (no AVG)NSD = -158.1 dBFS/Hz (2x AVG)NSD = -160.4 dBFS/Hz (4x AVG)Single core (non-interleaved) ADC architectureAperture jitter: 50 fsLow close-in residual phase noise:-127 dBc/Hz at 10 kHz offsetSpectral performance (f IN = 1 GHz, -4 dBFS):2x internal averagingSNR: 62.3 dBFSSFDR HD2,3: 63 dBcSFDR worst spur: 85 dBFSSpectral performance (f IN = 1.8 GHz, -4 dBFS):2x internal averagingSNR: 63 dBFSSFDR HD2,3: 68 dBcSFDR worst spur: 86 dBFSInput fullscale: 1.1 to 1.35 Vpp (2 to 3.5 dBm)Code error rate (CER): 10 -15Full power input bandwidth (-3 dB): 2.75 GHzJESD204B serial data interfaceMaximum lane rate: 13 GbpsSupports subclass 1 deterministic latencyDigital down-convertersUp to four DDC per ADC channelComplex output: 4x to 128x decimation48-bit NCO phase coherent frequency hoppingFast frequency hopping: < 1 usPower consumption: 2.6 W/channel (2x AVG)Power supplies: 1.8 V, 1.2 V14-Bit, dual channel 2.6 to 3-GSPS ADCNoise spectral density:NSD = -155.6 dBFS/Hz (no AVG)NSD = -158.1 dBFS/Hz (2x AVG)NSD = -160.4 dBFS/Hz (4x AVG)Single core (non-interleaved) ADC architectureAperture jitter: 50 fsLow close-in residual phase noise:-127 dBc/Hz at 10 kHz offsetSpectral performance (f IN = 1 GHz, -4 dBFS):2x internal averagingSNR: 62.3 dBFSSFDR HD2,3: 63 dBcSFDR worst spur: 85 dBFSSpectral performance (f IN = 1.8 GHz, -4 dBFS):2x internal averagingSNR: 63 dBFSSFDR HD2,3: 68 dBcSFDR worst spur: 86 dBFSInput fullscale: 1.1 to 1.35 Vpp (2 to 3.5 dBm)Code error rate (CER): 10 -15Full power input bandwidth (-3 dB): 2.75 GHzJESD204B serial data interfaceMaximum lane rate: 13 GbpsSupports subclass 1 deterministic latencyDigital down-convertersUp to four DDC per ADC channelComplex output: 4x to 128x decimation48-bit NCO phase coherent frequency hoppingFast frequency hopping: < 1 usPower consumption: 2.6 W/channel (2x AVG)Power supplies: 1.8 V, 1.2 V

Description

AI
The ADC32RF5x is a single core 14-bit, 2.6 GSPS to 3 GSPS, dual channel analog to digital converters (ADC) that supports RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161 dBFS/Hz. Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs. The ADC32RF54 and ADC32RF55 supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13 Gbps. The power efficient ADC architecture consumes 2.1 W/ch at 3 Gsps and provides power scaling with lower sampling rates. The ADC32RF5x is a single core 14-bit, 2.6 GSPS to 3 GSPS, dual channel analog to digital converters (ADC) that supports RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161 dBFS/Hz. Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs. The ADC32RF54 and ADC32RF55 supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13 Gbps. The power efficient ADC architecture consumes 2.1 W/ch at 3 Gsps and provides power scaling with lower sampling rates.