
CD74HC00E
ActiveTexas Instruments
4-CH, 2-INPUT, 2-V TO 6-V 5.2 MA DRIVE STRENGTH NAND GATE
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CD74HC00E
ActiveTexas Instruments
4-CH, 2-INPUT, 2-V TO 6-V 5.2 MA DRIVE STRENGTH NAND GATE
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Technical Specifications
Parameters and characteristics commom to parts in this series
Specification | CD74HC00E | 74HC00 Series |
---|---|---|
Current - Output High, Low | 5.2 mA, 5.2 mA | 5.2 mA |
Grade | - | Automotive |
Input Logic Level - High [Max] | 4.2 V | 4.2 - 5.9 V |
Input Logic Level - High [Min] | 1.5 V | 1.5 - 1.9 V |
Input Logic Level - Low [Max] | 1.8 V | 1.8 V |
Input Logic Level - Low [Min] | 0.5 V | 0.5 V |
Logic Type | NAND Gate | NAND Gate |
Max Propagation Delay @ V, Max CL | 15 ns | 13 - 15 ns |
Mounting Type | Through Hole | Surface Mount, Through Hole |
Number of Circuits | 4 | 4 |
Number of Inputs | 2 | 2 |
Operating Temperature [Max] | 125 °C | 85 - 125 °C |
Operating Temperature [Min] | -55 °C | -55 - -40 °C |
Package / Case | 14-DIP | 14-SOIC, 14-DIP, 14-TSSOP, 14-SSOP |
Package / Case | 7.62 mm | 3.9 - 7.62 mm |
Package / Case | 0.3 in | 0.154 - 5.3 in |
Package / Case | - | 0.173 in |
Package / Case | - | 4.4 mm |
Package / Case | - | 0.209 in |
Package / Case | - | 5.3 mm |
Package / Case | - | 0.209 in |
Qualification | - | AEC-Q100 |
Supplier Device Package | - | 14-TSSOP, 14-SSOP, 14-SO |
Voltage - Supply [Max] | 6 V | 6 V |
Voltage - Supply [Min] | 2 V | 2 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
74HC00 Series
4-ch, 2-input, 2-V to 6-V 5.2 mA drive strength NAND gate
Part | Package / Case | Package / Case | Package / Case | Max Propagation Delay @ V, Max CL | Voltage - Supply [Min] | Voltage - Supply [Max] | Input Logic Level - Low [Max] | Input Logic Level - Low [Min] | Number of Inputs | Operating Temperature [Min] | Operating Temperature [Max] | Number of Circuits | Logic Type | Input Logic Level - High [Max] | Input Logic Level - High [Min] | Mounting Type | Current - Output High, Low | Package / Case [custom] | Package / Case [custom] | Supplier Device Package | Grade | Qualification | Package / Case | Package / Case [y] | Package / Case [y] |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
Texas Instruments SN74HC00NThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 7.62 mm | 0.3 in | 14-DIP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Through Hole | 5.2 mA, 5.2 mA | ||||||||
7.62 mm | 0.3 in | 14-DIP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Through Hole | 5.2 mA, 5.2 mA | |||||||||
14-TSSOP | 13 ns | 2 V | 6 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 5.9 V | 1.9 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | ||||||||||
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
Texas Instruments SN74HC00PWThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | |||||||
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
Texas Instruments CD74HC00MThis device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -55 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
Texas Instruments SN74HC00QDRQ1This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | Automotive | AEC-Q100 | ||||||
Texas Instruments SN74HC00DBRThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 5.3 mm | 14-SSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 14-SSOP | 0.209 in | |||||||
14-SOIC | 13 ns | 2 V | 6 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 5.9 V | 1.9 V | Surface Mount | 5.2 mA, 5.2 mA | 14-SO | 5.3 mm | 0.209 in | ||||||||||
Texas Instruments SN74HC00DTThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments CD74HC00EThis device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 7.62 mm | 0.3 in | 14-DIP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -55 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Through Hole | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments SN74HC00PWRThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | |||||||
Texas Instruments SN74HC00NSRThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 14-SO | 5.3 mm | 0.209 in | |||||||
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -55 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
Texas Instruments SN74HC00QDRG4Q1This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | Automotive | AEC-Q100 | ||||||
Texas Instruments SN74HC00DRThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments CD74HC00MTThis device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -55 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments CD74HC00M96This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -55 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments SN74HC00QPWRG4Q1This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | Automotive | AEC-Q100 | |||||
14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | ||||||||
Texas Instruments SN74HC00PWRG4This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | |||||||
3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | |||||||||
14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | ||||||||
Texas Instruments SN74HC00DThis device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 3.9 mm | 0.154 in | 14-SOIC | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | ||||||||
Texas Instruments SN74HC00QPWRQ1This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND gates. Each gate performs the Boolean function Y =A ● Bin positive logic. | 14-TSSOP | 15 ns | 2 V | 6 V | 1.8 V | 0.5 V | 2 | -40 °C | 125 °C | 4 | NAND Gate | 4.2 V | 1.5 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | Automotive | AEC-Q100 | |||||
14-TSSOP | 13 ns | 2 V | 6 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 5.9 V | 1.9 V | Surface Mount | 5.2 mA, 5.2 mA | 0.173 in | 4.4 mm | 14-TSSOP | ||||||||||
7.62 mm | 0.3 in | 14-DIP | 13 ns | 2 V | 6 V | 2 | -40 °C | 85 °C | 4 | NAND Gate | 5.9 V | 1.9 V | Through Hole | 5.2 mA, 5.2 mA |
Description
General part information
74HC00 Series
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
This device contains four independent 2-input NAND Gates. Each gate performs the Boolean function Y =A ● Bin positive logic.
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Technical documentation and resources