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74BCT8374 Series
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SN74BCT8374ADWR
Texas Instruments
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Documents
Pricing
Specs
SN74BCT8374ADWR
Texas Instruments
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
Distributor
Package
Quantity
$
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
Distributor
Package
Quantity
$
