SN74ABT8652DWR

Obsolete

IC SCAN TEST DEVICE 28-SOIC

Obsolete

IC SCAN TEST DEVICE 28-SOIC

Description

General part information

Scan Test Device with Bus Transceiver and Registers IC 28-SOIC

Parameters and characteristics for this part

Specification	SN74ABT8652DWR

Logic Type	Bus Transceiver, Scan Test Device, Registers
Mounting Type	Surface Mount
Number of Bits	8 bits
Operating Temperature (Max)	85 °C
Operating Temperature (Min)	-40 °C
Package Length	0.295 in
Package Name	28-SOIC
Package Width	7.5 mm
Supply Voltage (Max)	5.5 V
Supply Voltage (Min)	4.5 V

Part	Logic Type	Number of Bits	Package Name	Mounting Type	Supply Voltage (Max)	Supply Voltage (Min)	Package Width	Package Length	Operating Temperature (Min)	Operating Temperature (Max)
Texas Instruments SN74ABT8652DWRG4	Bus Transceiver Registers Scan Test Device	8 bits	28-SOIC	Surface Mount	5.5 V	4.5 V	7.5 mm	0.295 in	-40 °C	85 °C
Texas Instruments SN74ABT8652DL	Bus Transceiver Registers Scan Test Device	8 bits	28-BSSOP	Surface Mount	5.5 V	4.5 V	7.5 mm	0.295 in	-40 °C	85 °C
Texas Instruments SN74ABT8652DW	Bus Transceiver Registers Scan Test Device	8 bits	28-SOIC	Surface Mount	5.5 V	4.5 V	7.5 mm	0.295 in	-40 °C	85 °C
Texas Instruments SN74ABT8652DLR	Bus Transceiver Registers Scan Test Device	8 bits	28-BSSOP	Surface Mount	5.5 V	4.5 V	7.5 mm	0.295 in	-40 °C	85 °C
Texas Instruments SN74ABT8652DWR	Bus Transceiver Registers Scan Test Device	8 bits	28-SOIC	Surface Mount	5.5 V	4.5 V	7.5 mm	0.295 in	-40 °C	85 °C

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3D models and CAD resources for this part

Technical documentation and resources