ADC08D1000 Series
8-Bit, Dual 1.0-GSPS or Single 2.0-GSPS Analog-to-Digital Converter (ADC)
Manufacturer: Texas Instruments
Catalog(1 parts)
Part | Configuration | Number of A/D Converters▲▼ | Input Type | Features | Sampling Rate (Per Second)▲▼ | Operating Temperature▲▼ | Operating Temperature▲▼ | Voltage - Supply, Analog▲▼ | Voltage - Supply, Analog▲▼ | Supplier Device Package | Data Interface | Mounting Type | Number of Bits▲▼ | Voltage - Supply, Digital▲▼ | Voltage - Supply, Digital▲▼ | Number of Inputs▲▼ | Ratio - S/H:ADC | Architecture | Reference Type |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments ADC08D1000CIYB/NOPB8 Bit Analog to Digital Converter 2 Input 2 Folding Interpolating 128-HLQFP (20x20) | MUX-S/H-ADC | 2 ul | Differential | Simultaneous Sampling | 1000000000 Ω | -40 °C | 85 °C | 1.7999999523162842 V | 2 V | 128-HLQFP (20x20) | LVDS - Parallel | Surface Mount | 8 ul | 1.7999999523162842 V | 2 V | 2 ul | 1:1 | Folding Interpolating | Internal |
Key Features
• Internal Sample-and-HoldSingle +1.9V ±0.1V OperationChoice of SDR or DDR Output ClockingInterleave Mode for 2x Sampling RateMultiple ADC Synchronization CapabilityEnsured No Missing CodesSerial Interface for Extended ControlFine Adjustment of Input Full-Scale Range and OffsetDuty Cycle Corrected Sample ClockInternal Sample-and-HoldSingle +1.9V ±0.1V OperationChoice of SDR or DDR Output ClockingInterleave Mode for 2x Sampling RateMultiple ADC Synchronization CapabilityEnsured No Missing CodesSerial Interface for Extended ControlFine Adjustment of Input Full-Scale Range and OffsetDuty Cycle Corrected Sample Clock
Description
AI
The ADC08D1000 is a dual, low power, high performance CMOS analog-to-digital converter that digitizes signals to 8 bits resolution at sampling rates up to 1.3 GSPS. Consuming a typical 1.6 Watts at 1 GSPS from a single 1.9 Volt supply, this device is ensured to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.4 ENOB with a 500 MHz input signal and a 1 GHz sample rate while providing a 10-18B.E.R. Output formatting is offset binary and the LVDS digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8V and 1.2V.
Each converter has a 1:2 demultiplexer that feeds two LVDS buses and reduces the output data rate on each bus to half the sampling rate. The two converters can be interleaved and used as a single 2 GSPS ADC.
The converter typically consumes less than 3.5 mW in the Power Down Mode and is available in a 128-lead, thermally enhanced exposed pad HLQFP and operates over the Industrial (-40°C ≤ TA≤ +85°C) temperature range.
Patenting Notice:
The Texas Instruments products covered by this datasheet are protected by at least the following U.S. patents: Pat. No. 6,847,320; Pat. No. 7,015,729; Pat. No. 7,068,195; and Pat. No. 7,088,281. This list of patents may not be all inclusive, and the products covered by this datasheet may be protected by additional issued patents and patents pending both in the U.S. and elsewhere in the world. A copy of this datasheet including the patent list noted here is also available on the Internetwww.ti.com/lit/gpn/adc08d1000. This is intended to serve as notice under 35 U.S.C. § 287(a).
The ADC08D1000 is a dual, low power, high performance CMOS analog-to-digital converter that digitizes signals to 8 bits resolution at sampling rates up to 1.3 GSPS. Consuming a typical 1.6 Watts at 1 GSPS from a single 1.9 Volt supply, this device is ensured to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.4 ENOB with a 500 MHz input signal and a 1 GHz sample rate while providing a 10-18B.E.R. Output formatting is offset binary and the LVDS digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8V and 1.2V.
Each converter has a 1:2 demultiplexer that feeds two LVDS buses and reduces the output data rate on each bus to half the sampling rate. The two converters can be interleaved and used as a single 2 GSPS ADC.
The converter typically consumes less than 3.5 mW in the Power Down Mode and is available in a 128-lead, thermally enhanced exposed pad HLQFP and operates over the Industrial (-40°C ≤ TA≤ +85°C) temperature range.
Patenting Notice:
The Texas Instruments products covered by this datasheet are protected by at least the following U.S. patents: Pat. No. 6,847,320; Pat. No. 7,015,729; Pat. No. 7,068,195; and Pat. No. 7,088,281. This list of patents may not be all inclusive, and the products covered by this datasheet may be protected by additional issued patents and patents pending both in the U.S. and elsewhere in the world. A copy of this datasheet including the patent list noted here is also available on the Internetwww.ti.com/lit/gpn/adc08d1000. This is intended to serve as notice under 35 U.S.C. § 287(a).