CD74ACT86-EP Series
Enhanced product 4-ch, 2-input, 4.5-V to 5.5-V XOR (exclusive OR) gates with TTL-compatible CMOS inp
Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/
Catalog
Enhanced product 4-ch, 2-input, 4.5-V to 5.5-V XOR (exclusive OR) gates with TTL-compatible CMOS inp
| Part | Max Propagation Delay @ V, Max CL | Number of Inputs | Operating Temperature [Min] | Operating Temperature [Max] | Number of Circuits | Current - Quiescent (Max) [Max] | Package / Case | Package / Case | Package / Case | Mounting Type | Current - Output High, Low [custom] | Current - Output High, Low [custom] | Logic Type | Input Logic Level - Low | Voltage - Supply [Max] | Voltage - Supply [Min] |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments CD74ACT86MDREP | 14.6 ns | 2 | -55 °C | 125 °C | 4 | 4 µA | 3.9 mm | 0.154 in | 14-SOIC | Surface Mount | 24 mA | 24 mA | XOR (Exclusive OR) | 0.8 V | 5.5 V | 4.5 V |
Texas Instruments V62/06620-01XE | 14.6 ns | 2 | -55 °C | 125 °C | 4 | 4 µA | 3.9 mm | 0.154 in | 14-SOIC | Surface Mount | 24 mA | 24 mA | XOR (Exclusive OR) | 0.8 V | 5.5 V | 4.5 V |
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Inputs Are TTL-Voltage CompatibleSpeed of Bipolar F, AS, and S, With Significantly Reduced Power ConsumptionBalanced Propagation Delays±24-mA Output Drive CurrentFanout to 15 F DevicesSCR-Latchup-Resistant CMOS Process and Circuit DesignExceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specifiedperformance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Inputs Are TTL-Voltage CompatibleSpeed of Bipolar F, AS, and S, With Significantly Reduced Power ConsumptionBalanced Propagation Delays±24-mA Output Drive CurrentFanout to 15 F DevicesSCR-Latchup-Resistant CMOS Process and Circuit DesignExceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specifiedperformance and environmental limits.
Description
AI
The CD74ACT86-EP is a quadruple 2-input exclusive-OR gate. This device performs the Boolean function Y = AB or Y =AB + ABin positive logic.
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.
The CD74ACT86-EP is a quadruple 2-input exclusive-OR gate. This device performs the Boolean function Y = AB or Y =AB + ABin positive logic.
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.