CD74HC08-EP Series
Enhanced product, 4-ch, 2-input 2-V to 6-V 5.2-mA drive strength AND gate
Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/
Catalog
Enhanced product, 4-ch, 2-input 2-V to 6-V 5.2-mA drive strength AND gate
| Part | Operating Temperature [Max] | Operating Temperature [Min] | Current - Output High, Low | Input Logic Level - Low [Max] | Input Logic Level - Low [Min] | Max Propagation Delay @ V, Max CL | Package / Case | Package / Case | Package / Case | Mounting Type | Number of Circuits | Input Logic Level - High [Max] | Input Logic Level - High [Min] | Number of Inputs | Voltage - Supply [Min] | Voltage - Supply [Max] | Logic Type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments CD74HC08QM96EP | 125 °C | -40 °C | 5.2 mA, 5.2 mA | 1.8 V | 0.5 V | 15 ns | 3.9 mm | 0.154 in | 14-SOIC | Surface Mount | 4 | 4.2 V | 1.5 V | 2 | 2 V | 6 V | AND Gate |
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeBuffered InputsTypical Propagation Delay 7 ns at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs ... 10 LSTTL LoadsBus Driver Outputs ... 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICs2-V to 6-V VCCOperationHigh Noise Immunity NILor NIH= 30% of VCCat VCC= 5 VCMOS Input Compatibility, Il1 µA at VOL, VOHComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeBuffered InputsTypical Propagation Delay 7 ns at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs ... 10 LSTTL LoadsBus Driver Outputs ... 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICs2-V to 6-V VCCOperationHigh Noise Immunity NILor NIH= 30% of VCCat VCC= 5 VCMOS Input Compatibility, Il1 µA at VOL, VOHComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description
AI
The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.
The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.