SN74LVTH182512-EP Series
Manufacturer: Texas Instruments
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ENHANCED PRODUCT 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
| Part | Operating Temperature (Min) | Operating Temperature (Max) | Logic Type | Number of Bits | Mounting Type | Package Width | Package Name | Package Length | Supply Voltage (Min) | Supply Voltage (Max) |
|---|---|---|---|---|---|---|---|---|---|---|
 Texas Instruments | -40 °C | 85 °C | ABT Scan Test Device Universal Bus Transceivers | 9 bits | Surface Mount | 6.1 mm | 64-TFSOP 64-TSSOP | 0.24 in | 2.7 V | 3.6 V |
 Texas Instruments | -40 °C | 85 °C | ABT Scan Test Device Universal Bus Transceivers | 18 bits | Surface Mount | 6.1 mm | 64-TFSOP 64-TSSOP | 0.24 in | 2.7 V | 3.6 V |