74HC4017 Series
Enhanced Product Decade Counter/Divider With 10 Decoded Outputs
Manufacturer: Texas Instruments
Catalog(11 parts)
Part | Timing | Mounting Type | Logic Type | Trigger Type | Grade | Operating Temperature▲▼ | Operating Temperature▲▼ | Package / Case▲▼ | Package / Case | Package / Case▲▼ | Direction | Number of Elements▲▼ | Supplier Device Package | Reset | Qualification | Count Rate▲▼ | Number of Bits per Element▲▼ | Voltage - Supply▲▼ | Voltage - Supply▲▼ | Package / Case▲▼ |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments CD74HC4017QPWRG4Q1Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-TSSOP | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | Automotive | -40 °C | 125 °C | 0.004394200164824724 m | 16-TSSOP | 0.004399999976158142 m | Up | 1 ul | 16-TSSOP | Asynchronous | AEC-Q100 | 35000000 Hz | 10 ul | 6 V | 2 V | |
Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-SOIC | Up | 1 ul | 16-SOIC | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.003911599982529879 m, 3.900000095367432 ul | |||||
Texas Instruments CD74HC4017M96Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-SOIC | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-SOIC | Up | 1 ul | 16-SOIC | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.003911599982529879 m, 3.900000095367432 ul | ||||
Synchronous | Through Hole | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-DIP | Up | 1 ul | 16-PDIP | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.007619999814778566 m, 0.007619999814778566 m | |||||
Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-SOIC | Up | 1 ul | 16-SOIC | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.003911599982529879 m, 3.900000095367432 ul | |||||
Texas Instruments CD74HC4017NSRE4Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-SO | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-SOIC (0.209", 5.30mm Width) | Up | 1 ul | 16-SO | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | |||||
Texas Instruments CD74HC4017PWRCounter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-TSSOP | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 0.004394200164824724 m | 16-TSSOP | 0.004399999976158142 m | Up | 1 ul | 16-TSSOP | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | |||
Texas Instruments CD74HC4017EG4Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-PDIP | Synchronous | Through Hole | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-DIP | Up | 1 ul | 16-PDIP | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.007619999814778566 m, 0.007619999814778566 m | ||||
Texas Instruments CD74HC4017QPWRQ1Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-TSSOP | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | Automotive | -40 °C | 125 °C | 0.004394200164824724 m | 16-TSSOP | 0.004399999976158142 m | Up | 1 ul | 16-TSSOP | Asynchronous | AEC-Q100 | 35000000 Hz | 10 ul | 6 V | 2 V | |
Texas Instruments CD74HC4017MTE4Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-SOIC | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | -55 °C | 125 °C | 16-SOIC | Up | 1 ul | 16-SOIC | Asynchronous | 35000000 Hz | 10 ul | 6 V | 2 V | 0.003911599982529879 m, 3.900000095367432 ul | ||||
Texas Instruments CD74HC4017QM96Q1Counter IC Counter, Decade 1 Element 10 Bit Positive, Negative 16-SOIC | Synchronous | Surface Mount | Counter, Decade | Negative, Positive | Automotive | -40 °C | 125 °C | 16-SOIC | Up | 1 ul | 16-SOIC | Asynchronous | AEC-Q100 | 35000000 Hz | 10 ul | 6 V | 2 V | 0.003911599982529879 m, 3.900000095367432 ul |
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeFully Static OperationBuffered InputsCommon ResetPositive Edge ClockingTypical fmax= 60 MHz at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs . . . 10 LSTTL LoadsBus Driver Outputs . . . 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICsVCCVoltage = 2 V to 6 VHigh Noise Immunity NILor NIH= 30% of VCC, VCC= 5 VComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeFully Static OperationBuffered InputsCommon ResetPositive Edge ClockingTypical fmax= 60 MHz at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs . . . 10 LSTTL LoadsBus Driver Outputs . . . 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICsVCCVoltage = 2 V to 6 VHigh Noise Immunity NILor NIH= 30% of VCC, VCC= 5 VComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description
AI
The CD74HC4017 is a high-speed silicon-gate CMOS 5-stage Johnson counter with ten decoded outputs. Each of the decoded outputs normally is low and sequentially goes high on the low-to-high transition clock period of the ten-clock-period cycle. The carry (TC) output transitions low to high after output 9 goes from high to low and can be used in conjunction with the clock enable (CE)\ input to cascade several stages. CE\ disables counting when in the high state. A master reset (MR) input also is provided that, when taken high, sets all the decoded outputs, except output 0, to low.
The device can drive up to ten low-power Schottky equivalent loads.
The CD74HC4017 is a high-speed silicon-gate CMOS 5-stage Johnson counter with ten decoded outputs. Each of the decoded outputs normally is low and sequentially goes high on the low-to-high transition clock period of the ten-clock-period cycle. The carry (TC) output transitions low to high after output 9 goes from high to low and can be used in conjunction with the clock enable (CE)\ input to cascade several stages. CE\ disables counting when in the high state. A master reset (MR) input also is provided that, when taken high, sets all the decoded outputs, except output 0, to low.
The device can drive up to ten low-power Schottky equivalent loads.