74ABT8646 Series
Manufacturer: Texas Instruments
IC SCAN-TEST-DEV/XCVR 28-SSOP
| Part | Operating Temperature (Min) | Operating Temperature (Max) | Number of Bits | Package Name | Supply Voltage (Max) | Supply Voltage (Min) | Package Width | Package Length | Mounting Type | Logic Type |
|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | -40 °C | 85 °C | 8 bits | 28-BSSOP | 5.5 V | 4.5 V | 7.5 mm | 0.295 in | Surface Mount | Bus Transceiver Registers Scan Test Device |
Texas Instruments | -40 °C | 85 °C | 8 bits | 28-SOIC | 5.5 V | 4.5 V | 7.5 mm | 0.295 in | Surface Mount | Bus Transceiver Registers Scan Test Device |
Texas Instruments | -40 °C | 85 °C | 8 bits | 28-BSSOP | 5.5 V | 4.5 V | 7.5 mm | 0.295 in | Surface Mount | Bus Transceiver Registers Scan Test Device |
Texas Instruments | -40 °C | 85 °C | 8 bits | 28-SOIC | 5.5 V | 4.5 V | 7.5 mm | 0.295 in | Surface Mount | Bus Transceiver Registers Scan Test Device |