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SN74LV374A-EP Series

Enhanced Product Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs

Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/

Catalog

Enhanced Product Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs

PartVoltage - Supply [Min]Voltage - Supply [Max]Current - Output High, Low [custom]Current - Output High, Low [custom]Current - Quiescent (Iq)Package / CasePackage / CasePackage / CaseSupplier Device PackageMounting TypeOperating Temperature [Max]Operating Temperature [Min]Input CapacitanceTypeNumber of Bits per ElementOutput TypeClock FrequencyMax Propagation Delay @ V, Max CLNumber of Elements [custom]FunctionTrigger Type
Texas Instruments
SN74LV374ATPWREP
2 V
5.5 V
16 mA
16 mA
20 çA
0.173 in
4.4 mm
20-TSSOP
20-TSSOP
Surface Mount
105 °C
-40 °C
2.9 pF
D-Type
8
Tri-State, Non-Inverted
170 MHz
10.1 ns
1
Standard
Positive Edge

Key Features

Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 105°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 105°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

AI
The SN74LV374A is an octal edge-triggered D-type flip-flop designed for 2-V to 5.5-V VCCoperation. This device features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. It is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. On the positive transition of the clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs. A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without need for interface or pullup components. OE\ does not affect internal operations of the latch. Old data can be retained or new data can be entered while the outputs are in the high-impedance state. To ensure the high-impedance state during power up or power down, OE\ should be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The SN74LV374A is an octal edge-triggered D-type flip-flop designed for 2-V to 5.5-V VCCoperation. This device features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. It is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. On the positive transition of the clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs. A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without need for interface or pullup components. OE\ does not affect internal operations of the latch. Old data can be retained or new data can be entered while the outputs are in the high-impedance state. To ensure the high-impedance state during power up or power down, OE\ should be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.