DIODE GEN PURP 600V 30A TO247-3
| Part | Current - Average Rectified (Io) | Current - Reverse Leakage @ Vr | Supplier Device Package | Operating Temperature - Junction [Max] | Reverse Recovery Time (trr) | Voltage - DC Reverse (Vr) (Max) [Max] | Technology | Package / Case | Voltage - Forward (Vf) (Max) @ If | Speed | Mounting Type | Operating Temperature - Junction |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
WeEn Semiconductors BYC30WT-600PQ | 30 A | 10 µA | TO-247-3 | 175 °C | 22 ns | 600 V | Standard | TO-247-3 | 2.75 V | 200 mA, 500 ns | Through Hole | |
WeEn Semiconductors BYC30W-600PT2Q | 30 A | 10 µA | TO-247-2 | 175 °C | 34 ns | 600 V | Standard | TO-247-2 | 2.75 V | 200 mA, 500 ns | Through Hole | |
WeEn Semiconductors BYC30W-600PQ | 30 A | 10 µA | TO-247-2 | 175 °C | 22 ns | 600 V | Standard | TO-247-2 | 2.75 V | 200 mA, 500 ns | Through Hole | |
WeEn Semiconductors BYC30-600P,127 | 30 A | 10 µA | TO-220AC | 175 °C | 35 ns | 600 V | Standard | TO-220-2 | 1.8 V | 200 mA, 500 ns | Through Hole | |
WeEn Semiconductors BYC30JT-600PSQ | 30 A | 10 µA | TO-3PF | 22 ns | 600 V | Standard | SC-93-3, TO-3PFM | 2.75 V | 200 mA, 500 ns | Through Hole | 175 °C | |
WeEn Semiconductors BYC30B-600PJ | 30 A | 10 µA | D2PAK | 175 °C | 35 ns | 600 V | Standard | D2PAK (2 Leads + Tab), TO-263-3, TO-263AB | 2.75 V | 200 mA, 500 ns | Surface Mount | |
WeEn Semiconductors BYC30-1200PQ | 30 A | 250 µA | TO-220AC | 175 °C | 65 ns | 1.2 kV | Standard | TO-220-2 | 3.3 V | 200 mA, 500 ns | Through Hole | |
WeEn Semiconductors BYC30WT-600PSQ | 30 A | 10 µA | TO-247-3 | 35 ns | 600 V | Standard | TO-247-3 | 2.75 V | 200 mA, 500 ns | Through Hole | 175 °C | |
WeEn Semiconductors BYC30Y-600PQ | 30 A | 10 µA | IITO-220-2L | 35 ns | 600 V | Standard | TO-220-2 | 2.75 V | 200 mA, 500 ns | Through Hole | 175 °C | |
WeEn Semiconductors BYC30DW-600PQ | 30 A | 10 µA | TO-247-2 | 175 °C | 33 ns | 600 V | Standard | TO-247-2 | 3.3 V | 200 mA, 500 ns | Through Hole |