SN54BCT8244A Series
Manufacturer: Texas Instruments
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SCAN TEST DEVICES WITH OCTAL BUFFERS
| Part | Package Width | Package Name | Package Length | Number of Bits | Supply Voltage (Max) | Supply Voltage (Min) | Logic Type | Mounting Type | Operating Temperature (Max) | Operating Temperature (Min) | Package / Case | Qualification | Grade |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
 Texas Instruments | 7.62 mm | 24-CDIP | 0.3 in | 8 bits | 5.5 V | 4.5 V | Buffers Scan Test Device | Through Hole | 125 °C | -55 °C | |||
 Texas Instruments | 11.43 mm | 28-LCCC | 0.45 in | 8 bits | 5.5 V | 4.5 V | Buffers Scan Test Device | Surface Mount | 125 °C | -55 °C | 28-CLCC | ||
 Texas Instruments | 7.62 mm | 24-CDIP | 0.3 in | 8 bits | 5.5 V | 4.5 V | Buffers Scan Test Device | Through Hole | 125 °C | -55 °C | MIL-PRF-38535L | Military |