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BQ7790400 Series

3-4S Low-Power Protector

Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/

Catalog

3-4S Low-Power Protector

PartFunctionFault ProtectionOperating Temperature [Max]Operating Temperature [Min]Mounting TypeSupplier Device PackagePackage / CasePackage / CasePackage / CaseBattery ChemistryNumber of Cells [Max]Number of Cells [Min]
Texas Instruments
BQ7790400PWR
Battery Protection
Over Current, Over Temperature, Over/Under Voltage
85 °C
-40 °C
Surface Mount
20-TSSOP
0.173 in
4.4 mm
20-TSSOP
Lithium Ion
4
3

Key Features

NORMAL mode: 6 µA (BQ77904 and BQ77905)Full suite of voltage, current, and temperature protectionsScalable cell count from 3 series to 20 series or moreVoltage protection (accuracy ±10 mV)Overvoltage: 3 V to 4.575 VUndervoltage: 1.2 V to 3 VOpen cell and open-wire detection (OW)Current ProtectionOvercurrent discharge 1: –10 mV to –85 mVOvercurrent discharge 2: –20 mV to +170 mVShort circuit discharge: –40 mV to +340 mVAccuracy ±20% for ≤ 20 mV, ±30% for > 20 mV across full temperatureTemperature protectionOvertemperature charge: 45°C or 50°COvertemperature discharge: 65°C or 70°CUndertemperature charge: –5°C or 0°CUndertemperature discharge: –20°C or –10°CAdditional FeaturesIndependent charge (CHG) and discharge (DSG) FET drivers36-V absolute maximum rating per cell inputBuilt-in-self-test functions for high reliabilitySHUTDOWN mode: 0.5-µA maximumFunctional Safety-CapableDocumentation available to aid functional safety system designNORMAL mode: 6 µA (BQ77904 and BQ77905)Full suite of voltage, current, and temperature protectionsScalable cell count from 3 series to 20 series or moreVoltage protection (accuracy ±10 mV)Overvoltage: 3 V to 4.575 VUndervoltage: 1.2 V to 3 VOpen cell and open-wire detection (OW)Current ProtectionOvercurrent discharge 1: –10 mV to –85 mVOvercurrent discharge 2: –20 mV to +170 mVShort circuit discharge: –40 mV to +340 mVAccuracy ±20% for ≤ 20 mV, ±30% for > 20 mV across full temperatureTemperature protectionOvertemperature charge: 45°C or 50°COvertemperature discharge: 65°C or 70°CUndertemperature charge: –5°C or 0°CUndertemperature discharge: –20°C or –10°CAdditional FeaturesIndependent charge (CHG) and discharge (DSG) FET drivers36-V absolute maximum rating per cell inputBuilt-in-self-test functions for high reliabilitySHUTDOWN mode: 0.5-µA maximumFunctional Safety-CapableDocumentation available to aid functional safety system design

Description

AI
The BQ77904 and BQ77905 devices are low-power battery pack protectors that implement a suite of voltage, current, and temperature protections without microcontroller (MCU) control. The device’s stackable interface provides simple scaling to support battery cell applications from 3 series to 20 series or more. Protection thresholds and delays are factory-programmed and available in a variety of configurations. Separate overtemperature and undertemperature thresholds for discharge (OTD and UTD) and charge (OTC and UTC) are provided for added flexibility. The device achieves pack protection through the integrated independent CHG and DSG low-side NMOS FET drivers, which may be disabled through two control pins. These control pins may also be used to achieve cell protection solutions for higher series (6 series and beyond) in a simple and economical manner. To do this, simply cascade a higher device CHG and DSG outputs to the immediate lower device control pins. For a reduced component count, all protection faults use internal delay timers. The BQ77904 and BQ77905 devices are low-power battery pack protectors that implement a suite of voltage, current, and temperature protections without microcontroller (MCU) control. The device’s stackable interface provides simple scaling to support battery cell applications from 3 series to 20 series or more. Protection thresholds and delays are factory-programmed and available in a variety of configurations. Separate overtemperature and undertemperature thresholds for discharge (OTD and UTD) and charge (OTC and UTC) are provided for added flexibility. The device achieves pack protection through the integrated independent CHG and DSG low-side NMOS FET drivers, which may be disabled through two control pins. These control pins may also be used to achieve cell protection solutions for higher series (6 series and beyond) in a simple and economical manner. To do this, simply cascade a higher device CHG and DSG outputs to the immediate lower device control pins. For a reduced component count, all protection faults use internal delay timers.