74AHCT08 Series
Enhanced product, 4-ch 2-input 4.5-V to 5.5-V AND gate with TTL-compatible inputs
Manufacturer: Texas Instruments
Catalog(12 parts)
Part | Number of Circuits▲▼ | Logic Type | Max Propagation Delay @ V, Max CL▲▼ | Voltage - Supply▲▼ | Voltage - Supply▲▼ | Mounting Type | Number of Inputs▲▼ | Operating Temperature▲▼ | Operating Temperature▲▼ | Input Logic Level - Low▲▼ | Package / Case | Package / Case▲▼ | Package / Case▲▼ | Current - Output High, Low▲▼ | Current - Output High, Low▲▼ | Supplier Device Package | Package / Case▲▼ | Package / Case▲▼ | Grade | Qualification | Package / Case▲▼ | Package / Case▲▼ |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Through Hole | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-DIP | 0.007619999814778566 m | 0.007619999814778566 m | 0.00800000037997961 A | 0.00800000037997961 A | ||||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-TSSOP | 0.00800000037997961 A | 0.00800000037997961 A | 14-TSSOP | 0.004394200164824724 m | 0.004399999976158142 m | |||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.003899999894201755 m | 0.003911599982529879 m | 0.00800000037997961 A | 0.00800000037997961 A | Automotive | AEC-Q100 | ||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-TSSOP | 0.00800000037997961 A | 0.00800000037997961 A | 14-TSSOP | 0.004394200164824724 m | 0.004399999976158142 m | |||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-VFQFN Exposed Pad | 0.00800000037997961 A | 0.00800000037997961 A | 14-VQFN (3.5x3.5) | |||||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.003899999894201755 m | 0.003911599982529879 m | 0.00800000037997961 A | 0.00800000037997961 A | ||||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-TSSOP | 0.00800000037997961 A | 0.00800000037997961 A | 14-TSSOP | 0.004394200164824724 m | 0.004399999976158142 m | Automotive | AEC-Q100 | |||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.003899999894201755 m | 0.003911599982529879 m | 0.00800000037997961 A | 0.00800000037997961 A | Automotive | AEC-Q100 | ||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.003899999894201755 m | 0.003911599982529879 m | 0.00800000037997961 A | 0.00800000037997961 A | ||||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.00800000037997961 A | 0.00800000037997961 A | 14-SO | 0.0052999998442828655 m | 0.005308600142598152 m | |||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-SOIC | 0.003899999894201755 m | 0.003911599982529879 m | 0.00800000037997961 A | 0.00800000037997961 A | ||||||||
4 ul | AND Gate | 7.899999765470511e-9 s | 5.5 V | 4.5 V | Surface Mount | 2 ul | -40 °C | 125 °C | 0.800000011920929 V | 14-VFQFN Exposed Pad | 0.00800000037997961 A | 0.00800000037997961 A | 14-VQFN (3.5x3.5) |
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessInputs Are TTL-Voltage CompatibleLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessInputs Are TTL-Voltage CompatibleLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.
Description
AI
The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic.
The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic.