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ADC32RF44 Series

Dual-Channel, 14-Bit, 2.6-GSPS RF-Sampling Analog-to-Digital Converter (ADC)

Manufacturer: Texas Instruments
Link to Manufacturer Page: https://www.ti.com/

Catalog

Dual-Channel, 14-Bit, 2.6-GSPS RF-Sampling Analog-to-Digital Converter (ADC)

PartMounting TypePackage / CaseSupplier Device PackageVoltage - Supply, Analog [Max]Voltage - Supply, Analog [Min]Operating Temperature [Min]Operating Temperature [Max]Reference TypeRatio - S/H:ADCVoltage - Supply, Digital [Min]Voltage - Supply, Digital [Max]Number of A/D ConvertersArchitectureNumber of InputsSampling Rate (Per Second)Number of BitsData InterfaceInput TypeConfiguration
Texas Instruments
ADC32RF44IRMPT
Surface Mount
72-VFQFN Exposed Pad
72-VQFN (10x10)
Texas Instruments
ADC32RF44IRMPR
Surface Mount
72-VFQFN Exposed Pad
72-VQFN (10x10)
1.25 V, 2 V
1.1 V, 1.8 V
-40 °C
85 °C
External
0:1
1.1 V
1.2 V
2
Pipelined
2
2.6 G
14
JESD204B, Serial
Differential
ADC
Texas Instruments
ADC32RF44IRMP
Surface Mount
72-VFQFN Exposed Pad
72-VQFN (10x10)
1.25 V, 2 V
1.1 V, 1.8 V
-40 °C
85 °C
External
1.1 V
1.2 V
2
Pipelined
2
2.6 G
14
JESD204B Serial
Differential
ADC

Key Features

14-Bit, Dual-Channel, 2.6-GSPS ADCNoise Floor: –154.2 dBFS/HzRF Input Supports Up to 4.0 GHzAperture Jitter: 90 fSChannel Isolation: 95 dB at fIN= 1.8 GHzSpectral Performance (fIN= 900 MHz, –2 dBFS):SNR: 61.2 dBFSSFDR: 65-dBc HD2, HD3SFDR: 79-dBc Worst SpurSpectral Performance (fIN= 1.85 GHz, –2 dBFS):SNR: 58.3 dBFSSFDR: 69-dBc HD2, HD3SFDR: 74-dBc Worst SpurOn-Chip Digital Down-Converters:Up to 4 DDCs (Dual-Band Mode)Up to 3 Independent NCOs per DDCOn-Chip Input Clamp for Overvoltage ProtectionProgrammable On-Chip Power Detectors with Alarm Pins for AGC SupportOn-Chip DitherOn-Chip Input TerminationInput Full-Scale: 1.35 VPPSupport for Multi-Chip SynchronizationJESD204B Interface:Subclass 1-Based Deterministic Latency4 Lanes Per Channel at 12.5 GbpsPower Dissipation: 2.95 W/Ch at 2.6 GSPS72-Pin VQFN Package (10 mm × 10 mm)14-Bit, Dual-Channel, 2.6-GSPS ADCNoise Floor: –154.2 dBFS/HzRF Input Supports Up to 4.0 GHzAperture Jitter: 90 fSChannel Isolation: 95 dB at fIN= 1.8 GHzSpectral Performance (fIN= 900 MHz, –2 dBFS):SNR: 61.2 dBFSSFDR: 65-dBc HD2, HD3SFDR: 79-dBc Worst SpurSpectral Performance (fIN= 1.85 GHz, –2 dBFS):SNR: 58.3 dBFSSFDR: 69-dBc HD2, HD3SFDR: 74-dBc Worst SpurOn-Chip Digital Down-Converters:Up to 4 DDCs (Dual-Band Mode)Up to 3 Independent NCOs per DDCOn-Chip Input Clamp for Overvoltage ProtectionProgrammable On-Chip Power Detectors with Alarm Pins for AGC SupportOn-Chip DitherOn-Chip Input TerminationInput Full-Scale: 1.35 VPPSupport for Multi-Chip SynchronizationJESD204B Interface:Subclass 1-Based Deterministic Latency4 Lanes Per Channel at 12.5 GbpsPower Dissipation: 2.95 W/Ch at 2.6 GSPS72-Pin VQFN Package (10 mm × 10 mm)

Description

AI
The ADC32RF44 device is a 14-bit, 2.6-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF44 delivers a noise spectral density of –154.2 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF44 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C). The ADC32RF44 device is a 14-bit, 2.6-GSPS, dual-channel, analog-to-digital converter (ADC) that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF44 delivers a noise spectral density of –154.2 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. Each ADC channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with front-end peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF44 supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C).