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1N4135UR

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Microchip Technology

100V 1600 OHMS ROUND-END VOLTAGE REGULATOR DO-213AA ROHS COMPLIANT: YES

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1N4135UR

Active
Microchip Technology

100V 1600 OHMS ROUND-END VOLTAGE REGULATOR DO-213AA ROHS COMPLIANT: YES

Technical Specifications

Parameters and characteristics commom to parts in this series

Specification1N4135UR1N4135UR-Zener-Diode Series
--
Current - Reverse Leakage @ Vr10 nA10 nA
Impedance (Max) (Zzt) [Max]1500 Ohms1500 Ohms
Mounting TypeSurface MountSurface Mount
Operating Temperature [Max]347 °F347 °F
Operating Temperature [Min]-65 ░C-65 ░C
Package / CaseDO-213AADO-213AA
Power - Max [Max]500 mW500 mW
Supplier Device PackageDO-213AADO-213AA
Tolerance5 %5 %
Voltage - Forward (Vf) (Max) @ If1.1 V1.1 V
Voltage - Zener (Nom) (Vz)100 V100 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyBulk 291$ 2.81
Microchip DirectN/A 1$ 3.02
NewarkEach 100$ 2.81
500$ 2.70

1N4135UR-Zener-Diode Series

Zener Diode Single 2-Pin 100V, 5%, 500mW DO-213AA Bag

PartOperating Temperature [Min]Operating Temperature [Max]Voltage - Forward (Vf) (Max) @ IfPower - Max [Max]Voltage - Zener (Nom) (Vz)Supplier Device PackageMounting TypeToleranceImpedance (Max) (Zzt) [Max]Current - Reverse Leakage @ VrPackage / Case
Microchip Technology
1N4135UR/TR
Microchip Technology
1N4135UR/TR
-65 ░C
347 °F
1.1 V
500 mW
100 V
DO-213AA
Surface Mount
5 %
1500 Ohms
10 nA
DO-213AA
Microchip Technology
1N4135UR
-65 ░C
347 °F
1.1 V
500 mW
100 V
DO-213AA
Surface Mount
5 %
1500 Ohms
10 nA
DO-213AA
Microchip Technology
1N4135UR

Description

General part information

1N4135UR-Zener-Diode Series

The 1N4099UR-1 through 1N4135UR-1 and 1N4614UR-1 through 1N4627UR-1 series are 500 mW, Zener voltage regulators in the axial-leaded, glass DO-213AA package. Voltages from 1.8 to 100V in 5%, 2%, and 1% tolerances are available. They are constructed with an internal metallurgical bond and are mil-qualified up to the JANS level for high reliability applications.