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LTC2754BIUKG-16#TRPBF - 52 QFN EP

LTC2754BIUKG-16#TRPBF

Active
Analog Devices

QUAD 12-/16-BIT SOFTSPAN IOUTDACS

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Search across all available documentation for this part.

DocumentsTape and Reel PackagingDatasheet+2
LTC2754BIUKG-16#TRPBF - 52 QFN EP

LTC2754BIUKG-16#TRPBF

Active
Analog Devices

QUAD 12-/16-BIT SOFTSPAN IOUTDACS

Deep-Dive with AI

DocumentsTape and Reel PackagingDatasheet+2

Technical Specifications

Parameters and characteristics for this part

SpecificationLTC2754BIUKG-16#TRPBF
ArchitectureMultiplying DAC
Data InterfaceSPI
Differential OutputTrue
INL/DNL (LSB)±2 (Max), ±1 (Max)
Mounting TypeSurface Mount
Number of Bits16
Number of D/A Converters4
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 °C
Output TypeCurrent - Unbuffered
Package / Case52-WFQFN Exposed Pad
Reference TypeExternal
Settling Time2 µs
Supplier Device Package52-QFN (7x8)
Voltage - Supply, Analog [Max]5.5 V
Voltage - Supply, Analog [Min]2.7 V
Voltage - Supply, Digital [Max]5.5 V
Voltage - Supply, Digital [Min]2.7 V

LTC2754-12 Series

Quad 12-/16-Bit SoftSpan IOUTDACs

PartSupplier Device PackageVoltage - Supply, Analog [Min]Voltage - Supply, Analog [Max]Package / CaseNumber of BitsDifferential OutputOutput TypeVoltage - Supply, Digital [Max]Voltage - Supply, Digital [Min]INL/DNL (LSB)Operating Temperature [Max]Operating Temperature [Min]Settling TimeData InterfaceReference TypeArchitectureNumber of D/A ConvertersMounting TypeINL/DNL (LSB)
Analog Devices
LTC2754BIUKG-16#TRPBF
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
16
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
±2 (Max)
85 °C
-40 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
Analog Devices
LTC2754IUKG-12#TRPBF
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
12 bits
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
85 °C
-40 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
Analog Devices
LTC2754AIUKG-16#TRPBF
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
16
Current - Unbuffered
5.5 V
2.7 V
85 °C
-40 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
0.2 LSB
0.4 LSB
Analog Devices
LTC2754BCUKG-16
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
16
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
±2 (Max)
70 °C
0 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
Analog Devices
LTC2754BIUKG-16#PBF
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
16
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
±2 (Max)
85 °C
-40 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
Analog Devices
LTC2754BCUKG-16#PBF
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
16
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
±2 (Max)
70 °C
0 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount
Analog Devices
LTC2754IUKG-12
52-QFN (7x8)
2.7 V
5.5 V
52-WFQFN Exposed Pad
12 bits
Current - Unbuffered
5.5 V
2.7 V
±1 (Max)
85 °C
-40 °C
2 µs
SPI
External
Multiplying DAC
4
Surface Mount

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 2000$ 31.60

Description

General part information

LTC2754-12 Series

The LTC2754 is a family of quad 12- and 16-bit multiplying serial-input, current-output digital-to-analog converters. They operate from a single 3V to 5V supply and are guaranteed monotonic over temperature. The LTC2754A-16 provides full 16-bit performance (±1LSB INL and DNL, max) over temperature without any adjustments. These SoftSpan™DACs offer six output ranges (up to ±10V) that can be programmed through the 3-wire SPI serial interface, or pinstrapped for operation in a single range.The content of any on-chip register (including DAC output- range settings) can be verified in just one instruction cycle; and if you change any register, that register will be automatically read back during the next instruction cycle.Voltage-controlled offset and gain adjustments are also provided; and the power-on reset circuit andCLRpin both reset the DAC outputs to 0V regardless of output range.ApplicationsHigh Resolution Offset and Gain AdjustmentProcess Control and Industrial AutomationAutomatic Test EquipmentData Acquisition Systems