923665-16

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3M (TC)

IC TEST CLIP, SOIC, 16 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES

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923665-16

Active

3M (TC)

IC TEST CLIP, SOIC, 16 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES

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Specifications Pricing Series Description Documents

Technical Specifications

Parameters and characteristics for this part

Specification	923665-16

Contact Finish	Gold
Contact Material	Copper Alloy
Number of Positions or Pins (Grid)	16
Type	SOIC
Type [x]	0.3 in

923665 Series

Part	Number of Positions or Pins (Grid)	Contact Finish	Contact Material	Type [x]	Type
3M (TC) 923665-18	18	Gold	Copper Alloy	0.3 in	SOIC
3M (TC) 923665-16	16	Gold	Copper Alloy	0.3 in	SOIC
3M (TC) 923665-28	28	Gold	Copper Alloy	0.3 in	SOIC

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

Digikey	Tray	1	$ 40.89
		5	$ 40.22
		10	$ 39.55
		25	$ 38.88
		50	$ 37.54
		100	$ 36.20
		250	$ 35.66
Newark	Each	25	$ 42.91
		50	$ 40.76
		100	$ 38.89
		200	$ 36.74
		500	$ 35.67

Description

General part information

923665 Series

Integrated circuit test clips are useful in prototype and production testing, quality control inspection and field service. IC test clips are an indispensable tool for the electronics industry. They make in-circuit IC testing safer by providing easy access to IC leads for probes without danger of shorting out valuable chips.

Documents

Technical documentation and resources