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923650-14 - 3M 923655-14

923650-14

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3M (TC)

IC TEST CLIP, SOIC, 14 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES

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923650-14 - 3M 923655-14

923650-14

Active
3M (TC)

IC TEST CLIP, SOIC, 14 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

Specification923650-14
Contact MaterialCopper Alloy
Number of Positions or Pins (Grid)14

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTray 1$ 34.80
5$ 34.24
10$ 33.68
30$ 33.12
50$ 32.56
100$ 31.44
250$ 30.31
NewarkEach 10$ 35.71
50$ 31.89
100$ 30.77
250$ 29.20
500$ 28.30
1000$ 27.63

Description

General part information

923650 Series

The 923650-14 is a surface-mount Test Clip with headless head provides downsized series made of smaller components and higher densities. Now hard to access surface-mount ICs can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. The surface-mount test clips are available in different pin sizes to accommodate a wide range of requirements. The industrial standard 0.25-inch square contact pins on 0.05-inch centres are staggered to permit easy attachment of IDC socket connectors or wire wrapping and help prevent shorting of adjacent probes. The clip allows safe, accurate and convenient testing of plastic leaded chip carrier (PLCC) and ceramic leadless chip carrier (LCC) style integrated circuits. The unique action wedge design of the test clip allows all four of its side to open simultaneously for one step, secure attachment to the PLCC being tested.

Documents

Technical documentation and resources