
923660-20
ActiveIC TEST CLIP, SOIC, 20 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES
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923660-20
ActiveIC TEST CLIP, SOIC, 20 CONTACTS, GOLD PLATED CONTACTS, 923 SERIES
Deep-Dive with AI
Technical Specifications
Parameters and characteristics for this part
| Specification | 923660-20 |
|---|---|
| Contact Material | Copper Alloy |
| Number of Positions or Pins (Grid) | 20 |
| Type | SOIC |
| Type [x] | 0.3 in |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
Description
General part information
923660 Series
The 923660-20 is a surface-mount Test Clip with headless head provides downsized series made of smaller components and higher densities. Now hard to access surface-mount ICs can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. The surface-mount test clips are available in different pin sizes to accommodate a wide range of requirements. The industrial standard 0.25-inch square contact pins on 0.05-inch centres are staggered to permit easy attachment of IDC socket connectors or wire wrapping and help prevent shorting of adjacent probes. The clip allows safe, accurate and convenient testing of plastic leaded chip carrier (PLCC) and ceramic leadless chip carrier (LCC) style integrated circuits. The unique action wedge design of the test clip allows all four of its side to open simultaneously for one step, secure attachment to the PLCC being tested.
Documents
Technical documentation and resources