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LTC2751CUHF-12#TRPBF - 38 QFN

LTC2751CUHF-12#TRPBF

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Analog Devices

CURRENT OUTPUT 12-/14-/16-BIT SOFTSPAN DACS WITH PARALLEL I/O

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LTC2751CUHF-12#TRPBF - 38 QFN

LTC2751CUHF-12#TRPBF

Active
Analog Devices

CURRENT OUTPUT 12-/14-/16-BIT SOFTSPAN DACS WITH PARALLEL I/O

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationLTC2751CUHF-12#TRPBF
ArchitectureMultiplying DAC
Data InterfaceParallel
Differential OutputTrue
INL/DNL (LSB)±1 (Max)
Mounting TypeSurface Mount
Number of Bits12 bits
Operating Temperature [Max]70 °C
Operating Temperature [Min]0 °C
Output TypeCurrent - Unbuffered
Package / Case38-WFQFN Exposed Pad
Reference TypeExternal
Settling Time2 µs
Voltage - Supply, Analog [Max]5.5 V
Voltage - Supply, Analog [Min]2.7 V
Voltage - Supply, Digital [Max]5.5 V
Voltage - Supply, Digital [Min]2.7 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 2500$ 7.63

Description

General part information

LTC2751 Series

The LTC2751 is a family of 12-, 14-, and 16-bit multiplying parallel-input, current-output DACs. They operate from a single 2.7V to 5.5V supply. All parts are guaranteed monotonic over temperature. The LTC2751A-16 provides 16-bit performance (±1LSB INL and DNL) overtemperature without any adjustments. These SoftSpan™DACs offer six output ranges — two unipolar and four bipolar — that can be programmed through the parallel interface, or pin strapped for operation in a single range.These parts use a bidirectional input/output parallel interface that allows read back of any on-chip register. A power-on circuit resets the DAC output to 0V when power is initially applied. A logic low on theCLRpin asynchronously clears the DAC to 0V in any output range.The parts are specified over commercial and industrial temperature ranges.ApplicationsHigh Resolution Offset and Gain AdjustmentProcess Control and Industrial AutomationAutomatic Test EquipmentData Acquisition Systems