ICT SPRING CONTACT TEST PROBE
| Part | Tip Type [diameter] | Tip Type | Tip Type [diameter] | Length - Tip | Length - Tip | Length - Overall [x] | Length - Overall [x] | Material - Tip | Material - Body | Current Rating (Amps) | Tip Type [diameter] |
|---|---|---|---|---|---|---|---|---|---|---|---|
Chip Shine / CSRF TOP050I064/100G | 0.025 in | Spring Tip - Serrated Head | 0.64 mm | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | |
Chip Shine / CSRF TOP050W05/200G | 0.02 in | Spring Tip - Dagger Head | 0.5 mm | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | |
Chip Shine / CSRF TOP050I064/200G | 0.025 in | Spring Tip - Serrated Head | 0.64 mm | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | |
Chip Shine / CSRF TOP050A05/100G | 0.02 in | Spring Tip - Pyramid Head | 0.5 mm | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | |
Chip Shine / CSRF TOP050H05/200G | Spring Tip - Crown Head | 0.02 in | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | 0.5 mm | |
Chip Shine / CSRF TOP050I05/100G | Spring Tip - Serrated Head | 0.02 in | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | 0.5 mm | |
Chip Shine / CSRF TOP050I05/200G | Spring Tip - Serrated Head | 0.02 in | 0.272 " | 6.9 mm | 43.15 mm | 1.7 in | Beryllium Copper, Gold Plated, Steel | Phosphor Copper, Gold Plated | 3 A | 0.5 mm |