LTC2657 Series

Octal I2C 16-/12-Bit Rail-to-Rail DACs with 10ppm/°C Max Reference

Catalog

Octal I2C 16-/12-Bit Rail-to-Rail DACs with 10ppm/°C Max Reference

Part	Operating Temperature [Max]	Operating Temperature [Min]	Number of Bits	Voltage - Supply, Analog [Min]	Voltage - Supply, Analog [Max]	Output Type	Mounting Type	INL/DNL (LSB)	Voltage - Supply, Digital [Max]	Voltage - Supply, Digital [Min]	Reference Type	Settling Time	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Package / Case [custom]	Data Interface	Number of D/A Converters	Package / Case	Voltage - Supply, Digital	Voltage - Supply, Analog
Analog Devices LTC2657CFE-L12#PBF	70 °C	0 °C	12 bits	2.7 V	5.5 V	Voltage - Buffered	Surface Mount	0.1 LSB 0.5 LSB	5.5 V	2.7 V	External Internal	3.9 µs	20-TSSOP-EP	0.173 in 4.4 mm	Exposed Pad	20-TSSOP	I2C	8
Analog Devices LTC2657IUFD-H12#TRPBF	85 °C	-40 °C	12 bits			Voltage - Buffered	Surface Mount	0.1 LSB 0.5 LSB			External Internal	3.9 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad	5 V	5 V
Analog Devices LTC2657BCUFD-H16#PBF	70 °C	0 °C	16			Voltage - Buffered	Surface Mount	0.3 LSB 2 LSB			External Internal	9.1 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad	5 V	5 V
Analog Devices LTC2657BCUFD-L16#PBF	70 °C	0 °C	16	2.7 V	5.5 V	Voltage - Buffered	Surface Mount	0.3 LSB 2 LSB	5.5 V	2.7 V	External Internal	9.1 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad
Analog Devices LTC2657BCFE-H16#TRPBF	70 °C	0 °C	16			Voltage - Buffered	Surface Mount	0.3 LSB 2 LSB			External Internal	9.1 µs	20-TSSOP-EP	0.173 in 4.4 mm	Exposed Pad	20-TSSOP	I2C	8		5 V	5 V
Analog Devices LTC2657BCFE-H16	70 °C	0 °C	16			Voltage - Buffered	Surface Mount	0.3 LSB 2 LSB			External Internal	9.1 µs	20-TSSOP-EP	0.173 in 4.4 mm	Exposed Pad	20-TSSOP	I2C	8		5 V	5 V
Analog Devices LTC2657CUFD-H12#PBF	70 °C	0 °C	12 bits			Voltage - Buffered	Surface Mount	0.1 LSB 0.5 LSB			External Internal	3.9 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad	5 V	5 V
Analog Devices LTC2657BCUFD-L16#TRPBF	70 °C	0 °C	16	2.7 V	5.5 V	Voltage - Buffered	Surface Mount	0.3 LSB 2 LSB	5.5 V	2.7 V	External Internal	9.1 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad
Analog Devices LTC2657IFE-L12#PBF	85 °C	-40 °C	12 bits	2.7 V	5.5 V	Voltage - Buffered	Surface Mount	0.1 LSB 0.5 LSB	5.5 V	2.7 V	External Internal	3.9 µs	20-TSSOP-EP	0.173 in 4.4 mm	Exposed Pad	20-TSSOP	I2C	8
Analog Devices LTC2657CUFD-H12#TRPBF	70 °C	0 °C	12 bits			Voltage - Buffered	Surface Mount	0.1 LSB 0.5 LSB			External Internal	3.9 µs	20-QFN (4x5)				I2C	8	20-WFQFN Exposed Pad	5 V	5 V

Catalog

Octal I2C 16-/12-Bit Rail-to-Rail DACs with 10ppm/°C Max Reference

Key Features

• Integrated Reference 10ppm/°C Max

• Maximum INL Error: ±4LSB

• Guaranteed Monotonic Over Temperature

• Selectable Internal or External Reference

• 2.7V to 5.5V Supply Range (LTC2657-L)

• Integrated Reference Buffers

• Ultralow Crosstalk between DACs(0.8nV•s)

• Power-On-Reset to Zero-Scale/Mid-Scale

• 400kHz I2C Interface

• Tiny 20-Lead 4mm × 5mm QFN and 20-Lead Thermally enhanced TSSOP Packages

Description

The LTC2657 is a family of octal I2C 16-/12-Bit Rail-to-Rail DACs with Integrated 10ppm/°C Max Reference. The DACs have built-in high performance, rail-to-rail, output buffers and are guaranteed monotonic. The LTC2657-L has a full-scale output of 2.5V with the integrated reference and operates from a single 2.7V to 5.5V supply. The LTC2657-H has a full-scale output of 4.096V with the integrated reference and operates from a 4.5V to 5.5V supply. Each DAC can also operate with an external reference, which sets the full-scale output to 2 times the external reference voltage.The parts use a 2-wire I2C compatible serial interface. The LTC2657 operates in both the standard mode (maximum clock rate of 100kHz) and the fast mode (maximum clock rate of 400kHz). The LTC2657 incorporates a power-on reset circuit that is controlled by the PORSEL pin. If PORSEL is tied to GND the DACs reset to zero-scale at power-up. If PORSEL is tied to VCC, the DACs reset to mid-scale at power-up.ApplicationsMobile CommunicationsProcess Control and Industrial AutomationInstrumentationAutomatic Test EquipmentAutomotive