Zenode.ai Logo
DS2174Q - MAX180CCQH+TD

DS2174Q

Active
Analog Devices Inc./Maxim Integrated

IC TELECOM INTERFACE 44PLCC

Deep-Dive with AI

Search across all available documentation for this part.

DocumentsDatasheet
DS2174Q - MAX180CCQH+TD

DS2174Q

Active
Analog Devices Inc./Maxim Integrated

IC TELECOM INTERFACE 44PLCC

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics commom to parts in this series

SpecificationDS2174QDS2174 Series
Current - Supply50 mA50 mA
FunctionEnhanced Bit Error Rate Tester (EBERT)Enhanced Bit Error Rate Tester (EBERT)
InterfaceJ1, T1, E1J1, T1, E1
Mounting TypeSurface MountSurface Mount
Number of Circuits11
Operating Temperature [Max]70 °C70 - 85 °C
Operating Temperature [Min]0 °C-40 - 0 °C
Package / Case44-LCC (J-Lead)44-LCC (J-Lead)
Supplier Device Package44-PLCC (16.59x16.59)44-PLCC (16.59x16.59)
Voltage - Supply [Max]3.6 V3.6 V
Voltage - Supply [Min]3 V3 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$

DS2174 Series

IC TELECOM INTERFACE 44PLCC

PartNumber of CircuitsOperating Temperature [Max]Operating Temperature [Min]Package / CaseFunctionCurrent - SupplyInterfaceVoltage - Supply [Max]Voltage - Supply [Min]Supplier Device PackageMounting Type
Analog Devices Inc./Maxim Integrated
DS2174Q
1
70 °C
0 °C
44-LCC (J-Lead)
Enhanced Bit Error Rate Tester (EBERT)
50 mA
E1, J1, T1
3.6 V
3 V
44-PLCC (16.59x16.59)
Surface Mount
Analog Devices Inc./Maxim Integrated
DS2174QN+
1
85 °C
-40 °C
44-LCC (J-Lead)
Enhanced Bit Error Rate Tester (EBERT)
50 mA
E1, J1, T1
3.6 V
3 V
44-PLCC (16.59x16.59)
Surface Mount

Description

General part information

DS2174 Series

Telecom IC Enhanced Bit Error Rate Tester (EBERT) 44-PLCC (16.59x16.59)

Documents

Technical documentation and resources