
TOP100BB15/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
Deep-Dive with AI
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TOP100BB15/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
Deep-Dive with AI
DocumentsDatasheet
Technical Specifications
Parameters and characteristics for this part
| Specification | TOP100BB15/200G |
|---|---|
| Current Rating (Amps) | 3 A |
| Length - Overall [x] | 33.27 mm |
| Length - Overall [x] | 1.31 in |
| Length - Tip [x] | 8.35 mm |
| Length - Tip [x] | 0.329 in |
| Material - Body | Phosphor Copper, Gold Plated |
| Material - Tip | Beryllium Copper, Steel, Gold Plated |
| Tip Type | Spring Tip - Pyramid Head |
| Tip Type [diameter] | 1.5 mm |
| Tip Type [diameter] | 0.059 in |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
TOP100 Series
3 A Spring Tip - Pyramid Head, 0.059" (1.50mm) Dia
Documents
Technical documentation and resources