NFP-3 is a near field probe used with RIGOL DSA series spectrum analyzer for the EMI tests of electronic products. It can be used to test the magnetic field strength and magnetic field coupling channels on the surface of the electronic components as well as the magnetic field environment near the electronic module so as to quickly locate the interference source. NFP-3 includes four models (NFP-3-P1, NFP-3-P2, NFP-3-P3 and NFP-3-P4). It is used to locate the EMI radiation interference source and determine the frequency and relative strength of the spectral component of the interference source.