TOP050WN05/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
TOP050WN05/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
Description
General part information
TOP050WN05/200G
ICT SPRING CONTACT TEST PROBE
Technical Specifications
Parameters and characteristics for this part
| Specification | TOP050WN05/200G |
|---|---|
| Current Rating | 3 A |
| Length - Overall | 1.7 in |
| Length - Tip | 0.272 in |
| Material - Body | Gold Plated, Phosphor Copper |
| Material - Tip | Steel, Beryllium Copper |
| Operating Temperature (Max) | 120 °C |
| Operating Temperature (Min) | -55 °C |
| Tip Diameter | 0.02 in |
| Tip Plating | Gold Plated |
| Tip Type | Spring Tip - Double Dagger Head |
Pricing
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CAD
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Documents
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