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KIT33662LEFEVBE

KIT33662LEFEVBE

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NXP USA Inc.

EVALUATION BOARD, MC33662L, LIN 2.1/SAEJ2602-2, LIN PHYSICAL LAYER

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KIT33662LEFEVBE

KIT33662LEFEVBE

Active
NXP USA Inc.

EVALUATION BOARD, MC33662L, LIN 2.1/SAEJ2602-2, LIN PHYSICAL LAYER

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Description

General part information

KIT33662LEFEVBE

The KIT33662LEFEVBE is an evaluation module for MC33662L, LIN2.1/SAEJ2602-2, LIN physical layer. This kit is populated with a production device, and gives to you the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for electro static discharge (ESD) and bulk current injection (BCI) tests.

Technical Specifications

Parameters and characteristics for this part

SpecificationKIT33662LEFEVBE
ContentsBoard
FunctionLIN
TypeInterface
Utilized IC / PartMC33662

Pricing

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CAD

3D models and CAD resources for this part