
TOP050I064/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
Deep-Dive with AI
Search across all available documentation for this part.
DocumentsDatasheet

TOP050I064/200G
ActiveChip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
Deep-Dive with AI
DocumentsDatasheet
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
TOP050 Series
3 A Spring Tip - Serrated Head, 0.025" (0.64mm) Dia
Documents
Technical documentation and resources