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JANTXV1N4106UR-1

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Microchip Technology

DIODE ZENER SINGLE 12V 5% 0.5W 2-PIN MELF DO-213AA BAG

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JANTXV1N4106UR-1

Active
Microchip Technology

DIODE ZENER SINGLE 12V 5% 0.5W 2-PIN MELF DO-213AA BAG

Technical Specifications

Parameters and characteristics commom to parts in this series

SpecificationJANTXV1N4106UR-1JANTXV1N4106UR-1-Zener-Diode Series
--
Current - Reverse Leakage @ Vr50 nA50 nA
GradeMilitaryMilitary
Impedance (Max) (Zzt) [Max]200 Ohms200 Ohms
Mounting TypeSurface MountSurface Mount
Operating Temperature [Max]347 °F347 °F
Operating Temperature [Min]-65 ░C-65 ░C
Package / CaseDO-213AADO-213AA
Power - Max [Max]500 mW500 mW
QualificationMIL-PRF-19500/435MIL-PRF-19500/435
Supplier Device PackageDO-213AADO-213AA
Tolerance5 %5 %
Voltage - Forward (Vf) (Max) @ If1.1 V1.1 V
Voltage - Zener (Nom) (Vz)12 V12 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyBulk 125$ 10.83
Microchip DirectN/A 1$ 11.66

JANTXV1N4106UR-1-Zener-Diode Series

Zener Diode Single 2-Pin 12V, 5%, 500mW DO-213AA Bag

PartOperating Temperature [Min]Operating Temperature [Max]Impedance (Max) (Zzt) [Max]Voltage - Forward (Vf) (Max) @ IfMounting TypeVoltage - Zener (Nom) (Vz)QualificationPower - Max [Max]Package / CaseCurrent - Reverse Leakage @ VrGradeSupplier Device PackageTolerance
Microchip Technology
JANTXV1N4106UR-1/TR
Microchip Technology
JANTXV1N4106UR-1
-65 ░C
347 °F
200 Ohms
1.1 V
Surface Mount
12 V
MIL-PRF-19500/435
500 mW
DO-213AA
50 nA
Military
DO-213AA
5 %
Microchip Technology
JANTXV1N4106UR-1

Description

General part information

JANTXV1N4106UR-1-Zener-Diode Series

The 1N4099UR-1 through 1N4135UR-1 and 1N4614UR-1 through 1N4627UR-1 series are 500 mW, Zener voltage regulators in the axial-leaded, glass DO-213AA package. Voltages from 1.8 to 100V in 5%, 2%, and 1% tolerances are available. They are constructed with an internal metallurgical bond and are mil-qualified up to the JANS level for high reliability applications.